Intel Corporation

Janice C Lee

Vivek K De

Tanay Karnik

Shih-Lien L Lu

Nam Sung Kim

Keith A Bowman

James W Tschanz

Christopher B Wilkerson

Ali Keshavarzi

Juanita N Kurtin

Chris Wilkerson

Timothy L Deeter

James Tachanz

Tanay Karnlk

Sequential circuits with error-detection are provided. They may, for example, be used to replace traditional master-slave flip-flops, e.g., in critical path circuits to detect and initiate correction of late transitions at the input of the sequential. In some embodiments, such sequentials may comprise a transition detector with a time borrowing latch.

Sequential circuit with error detection

In one embodiment of the invention, a fuse element for a one time programmable memory may include carbon nanotubes coupled to a first transistor node and to a second transistor node. The carbon nanotubes may have a first resistance which may be changed upon programming the memory cell with low current levels.

Carbon nanotube fuse element

Growing community of inventors

Beaverton, OR, United States of America

Janice C Lee