Samsung Electronics Co., Ltd.

Janghyuk An

Dong-Uk Ryu

Seongbeom Kim

Yong In Lee

Manyoung Shin

A Compute Express Link (CXL) memory device includes: memory cell groups configured to store data; one or more sensors configured to measure degradation factors of the memory cell groups; and a control component configured to: receive a memory allocation request from a host device connected to the CXL memory device using CXL; and perform memory allocation of the memory cell groups for the host device based on degradation states of the memory cell groups according to the degradation factors of the memory cell groups.

Memory device and method with compute express link for degradation

An electronic device including a processor and a sensor may be provided. The processor obtains a first degree of degradation of a first core based on a first parameter value associated with a lifetime of the first core and a first operating level associated with an operation of the first core. The processor obtains a second degree of degradation of a second core based on a second parameter value associated with a lifetime of the second core and a second operating level associated with an operation of the second core. The processor schedules a task of the first core and the second core based on the first degree of degradation and the second degree of degradation. The sensor provides the first parameter value and the first operating level to the first core and the second parameter value and the second operating level to the second core.

Electronic device for managing degree of degradation

A test system method for testing software of each of a plurality of system on chips (SoCs) are provided. The test system includes: a plurality of test units configured to test the plurality of SoCs according to a plurality of test cases, respectively; a power supplier configured to supply, to each of the plurality of test units, power of a level corresponding to a corresponding test case, among the plurality of test cases; a temperature controller configured to provide, to each of the plurality of test units, a temperature control signal according to the corresponding test case, and to monitor a measurement temperature, provided from each of the plurality of test units, of each of the plurality of SoCs; and an analyzer configured to analyze at least one of a driving voltage, a driving current, and a driving frequency of each of the plurality of SoCs.

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Yongin-si, South Korea

Janghyuk An