Robert Boschgmbh

Samsung Sdi Co., Inc.

Takata Ag

Gs Yuasa International Ltd.

Jan Salziger

Ralf Angerbauer

Gergely Galamb

Marcus Ted Kandler

Ulrich Lange

Joshua Anzicek

David Rychtarik

Frank Schneider

Andreas Gleiter

Thomas Klemen

Christian Schmid-Schoenbein

Dylan Propst

Mattis Simeon Weiss

Benjamin Grauer

Mareen Rosenkranz

Daniel Mack

Lena Loewenau

Rainer Heinrich Hoerlein

Sven Landa

The disclosure relates to a method for determining the aging of an electronic interrupter element which is configured to open and close a power circuit. The method according to the disclosure comprises the following steps: a) initializing an aging counter NWear, b) determining the amount I of a current which flows through the electronic interrupter element upon opening the power circuit, c) determining a current-dependent aging value Nwear (I) from the amount I of the current, d) refreshing the aging counter NWear using the current-dependent aging value Nwear (I). The disclosure further relates to a computer program and to an apparatus for determining the aging of an electronic interrupter element and to a battery management system which are in particular configured to carry out the method.

Method and apparatus for determining the aging of an electronic interrupter element, in particular of a power contactor

A method and a device for testing an electronic appliance for determining at least one variable of a system. The electronic appliance is designed in the form of a sensor. The method includes defining an expected minimum and/or maximum value of the variable and producing an electric signal by means of the electronic appliance depending on the variable. The method also includes detecting at least one value of a parameter of the produced electric signal and defining an expected minimum and/or maximum value of the parameter depending on the defined minimum and/or maximum value of the variable of the system. A determination is made, based on whether the detected value of the parameter is greater than the minimum value defined for the parameter and/or smaller than the maximum value, whether there is a malfunction of the electronic appliance provoked by an external electromagnetic interference field.

Method and device for testing an electronic appliance

Growing community of inventors

Esslingen, Germany

Jan Salziger