Robert Boschgmbh

Samsung Sdi Co., Inc.

Takata Ag

Gs Yuasa International Ltd.

Jan Salziger

Gergely Galamb

Marcus Ted Kandler

Ulrich Lange

Joshua Anzicek

Frank Schneider

Christian Schmid-Schoenbein

Andreas Gleiter

Dylan Propst

Benjamin Grauer

Rainer Heinrich Hoerlein

Sven Landa

Mareen Rosenkranz

Daniel Mack

Lena Loewenau

The disclosure relates to a method for determining the aging of an electronic interrupter element which is configured to open and close a power circuit. The method according to the disclosure comprises the following steps: a) initializing an aging counter NWear, b) determining the amount I of a current which flows through the electronic interrupter element upon opening the power circuit, c) determining a current-dependent aging value Nwear (I) from the amount I of the current, d) refreshing the aging counter NWear using the current-dependent aging value Nwear (I). The disclosure further relates to a computer program and to an apparatus for determining the aging of an electronic interrupter element and to a battery management system which are in particular configured to carry out the method.

Method and apparatus for determining the aging of an electronic interrupter element, in particular of a power contactor

A method and a device for testing an electronic appliance for determining at least one variable of a system. The electronic appliance is designed in the form of a sensor. The method includes defining an expected minimum and/or maximum value of the variable and producing an electric signal by means of the electronic appliance depending on the variable. The method also includes detecting at least one value of a parameter of the produced electric signal and defining an expected minimum and/or maximum value of the parameter depending on the defined minimum and/or maximum value of the variable of the system. A determination is made, based on whether the detected value of the parameter is greater than the minimum value defined for the parameter and/or smaller than the maximum value, whether there is a malfunction of the electronic appliance provoked by an external electromagnetic interference field.

Method and device for testing an electronic appliance

Growing community of inventors

Esslingen, Germany

Jan Salziger