Tecom As

Tecom As C/o Christian Michelsen Research As

Jan Kocbach

Kjetil Haukalid

Kjetil Folgero

Kjetil Folgeroe

Kjetil FolgerØ

A system and method that permits measuring properties and thickness of a dielectric layer, particularly a dielectric layer close to a pipeline wall, and more particularly fluids flowing inside a pipe is provided. The present invention attains the above described objective by a system comprising a sensor operating in a material characterization mode in a first frequency range and a sensor operating in a thickness characterization mode in a second frequency range, and a method for operating said system.

Permittivity measurements of layers

An inline measuring apparatus () is operable to measure hydrate, wax, break-through of formation water and/or scale () on an inside surface of a wall () of a pipe () for guiding fluid. The apparatus () includes an electronics unit () coupled to a sensor arrangement () disposed in a spatial extensive manner into the wall () of the pipe () for sensing the growth (). The electronics unit () in cooperation with the sensor arrangement () Is operable to perform a series of dielectric measurements at a plurality of interrogating frequencie s for determining a nature and spatial extent of the growth (). The sensor arrangement () includes a plurality of sensors have mutually different sensing characteristics in relation to their spatial sensing region and/or their sensitivity to different fluid components present in operation within the pipe (). Optionally, the apparatus () is capable of being operated synergistically in a plurality of different operating modes which enables detection of thin film formation at an inside wall of the pipe () as well as a measurement of bulk properties of fluid present within the pipe ().

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Bergen, Norway

Jan Kocbach