Asml Netherlands B.v.

Jan-Jaap Kuit

Sjoerd Nicolaas Lambertus Donders

Frank Staals

Paulus Martinus Maria Liebregts

Marcel Koenraad Marie Baggen

Dirk-Jan Bijvoet

Jan Frederik Hoogkamp

Alexander Hendrikus Martinus Van Der Hoff

Albert Johannes Maria Jansen

Peter Schaap

Doede Frans Kuiper

Arjan Martin Van Der Wel

Nick Snijders

Niek Snijders

Joep Janssen

Hubrecht Bastiaan Jasperse

In a lithographic apparatus, a control system is provided to automatically reduce throughput in the event that lens-heating aberrations exceed a certain threshold. The determination of whether lens-heating aberrations will exceed the threshold may be based upon a prediction, e.g. using a lens-heating model, or on measurements taken from a previously exposed substrate. Reduction of throughput of the device manufacture may be effected by reducing beam power or the duty cycle of the apparatus. In a particular embodiment, the time taken for substrate movement between exposure portions is increased.

Lithographic apparatus and device manufacturing method

The invention relates to a method of loading a first object on a second object in a lithographic apparatus. The method includes: a) loading the first object on the second object, b) waiting a predetermined time interval and c) performing a relaxation action. The first object may be a substrate and the second object a substrate table. The first object may also be a substrate table and the second object a support structure, supporting the substrate table.

Method of loading a substrate on a substrate table and lithographic apparatus and device manufacturing method

A lithographic apparatus having an illumination system configured to condition a radiation beam, a support constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam, a substrate table constructed to hold a substrate; a projection system configured to project the patterned radiation beam onto a target portion of the substrate; and, an actuator arranged to exert a force on an object, wherein the apparatus includes a thermal expansion error compensator configured to avoid an error caused by thermal expansion of the object by any heat dissipated by the actuator or another heat source.

An immersion lithographic apparatus is provided in which a maximum permissible velocity of the substrate relative to a fluid confinement structure that controls the immersion fluid is determined based on a property of the substrate to be exposed and, during the exposure process, the velocity of the substrate relative to the fluid confinement structure is limited to be below this maximum permissible velocity.

A stage apparatus for displacing an object having a substantially flat surface is described. The apparatus includes an object table for supporting the object and a positioning device for displacing the object table in a first direction. The apparatus further includes a clamping device for clamping the object to the object table by a first clamping force, the first clamping force being controlled by an electronic control unit based upon a state of the object.

Stage apparatus, lithographic apparatus and device manufacturing method

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Veldhoven, Netherlands

Jan-Jaap Kuit