Max-planck-gesellschaft Zur F&#xf6;rderung Der Wissenschaften E. V.

Carl Zeiss Microscopy Gmbh

University of California

Wisconsin Alumni Research Foundation

Jan Huisken

Helmut Lippert

Florian Fahrbach

Jörg Siebenmorgen

Gopi Shah

Andrea Bassi

Benjamin Schmid

Method for imaging regions of a sample using a light source and an optical detection means and at least one device for moving the sample in three dimensions, comprising the following method steps: a) introducing at least one magnetic element into the sample, b) applying a magnetic field by means of the at least one device for moving the sample in three dimensions, the magnetic field interacting with the at least one magnetic element introduced into the sample, c) arranging the region of the sample in a radiation region of the light source and in a detection region of the detection means, d) emitting first light beams from the light source onto the sample, e) generating second light beams by means of the sample, f) recording an image of a region of the sample by capturing a proportion, incident on the detection means from the sample, of the second light beams, g) moving the at least one magnetic element and the sample containing this at least one magnetic element by varying the magnetic field, h) repeating steps d) to g) until a predeterminable number of images have been recorded.

Imaging method using magnetic elements and device for this purpose

The invention relates to a light microscope for examining microscopic objects with high throughput. The microscope comprises a light source for illuminating a measuring zone, a sample vessel, in which the microscopic objects can be successively moved into the measuring zone, and a detection device for measuring detection light, which originates from a microscopic object located in the measuring zone. According to the invention, the microscope is characterized in that the imaging means comprise a detection lens having a stationary front optics and movable focusing optics, wherein the focusing optics is arranged behind the front optics and in front of an intermediate image plane, and can be adjusted for the height adjustment of a detection plane. The invention further relates to a corresponding microscopy method.

Light microscope with inner focusing objective and microscopy method for examining a plurality of microscopic objects

The invention is directed to a method for creating an optical tomogram, which comprises the steps providing an optical microscope, arranging a sample () in the optical coverage region of a lens () of the microscope, setting the focus of the lens to a particular focal plane (), recording an image of the sample through the microscope, rotating the sample through an angle &#x3b1;, optionally displacing the sample along the longitudinal axis (z) of the lens () and/or perpendicular to the plane of the previously recorded image () and continuing the method with step d) until a predetermined number of section images () of the sample () have been recorded, wherein the sample () is displaced along the longitudinal axis (z) of the lens () and/or perpendicular to the plane of the previously recorded image (), in accordance with step f), at least once during a rotation of the sample through 360&#xb0;. Furthermore the invention is directed to an optical microscope for creating tomograms, which comprises at least one lens (), at least one sample suspension device () and at least one illumination device (), wherein the sample suspension device () is rotatable about an axis () arranged perpendicular to the longitudinal axis (z) of the lens () and is displaceable along the longitudinal axis (z) of the lens ().

Device and method for creating an optical tomogram of a microscopic sample

A method and device for multi-directional selective plane illumination microscopy is provided. A detector focal plane is alternately illuminated with at least two counter-propagating, coplanar light sheets, and an image of a specimen cross-section positioned in the focal plane is detected while only one light sheet illuminates the specimen. The wavefront of the illumination beams may be deformed with adaptive optics using feedback from light transmitted through the specimen. Multiple images of the specimen cross-section may be detected at different times and specimen positions and orientations to produce multi-view image stacks which may be processed using image fusion to produce a reconstructed image representation of the specimen. Additionally, the direction of propagation of the alternating light sheets may be pivoted in the focal plane while detecting the image.

Growing community of inventors

Dresden, Germany

Jan Huisken