Adv Antest Corporation

Ims Connector Systems Gmbh

Jan Hesselbarth

José Moreira

Roland Baumgärtner

Zunnurain Ahmad

Serafin Fischer

An embodiment provides a measurement arrangement for characterizing a radio frequency arrangement comprising a plurality of antennas. Measurement arrangement comprises a dielectric waveguide slab with a plurality of frequency converting structures, arranged in or on the dielectric waveguide slab. Measurement arrangement further comprises a plurality of waveguide transitions arranged at different positions of the dielectric waveguide slab and are coupled to respective radio frequency components. Radio frequency components are configured to transmit and/or receive radio signals. Frequency converting structures are associated with respective antennas of the plurality of antennas, and are configured to perform a frequency conversion on signals received, resulting in frequency-converted signals. Frequency converting structures are further configured to couple respective antennas with the dielectric slab in a frequency converting manner to establish a frequency-converting coupling between the antennas and the plurality of waveguide transitions to cause a frequency-converting coupling between the antennas and the radio frequency components.

Measurement arrangement for characterizing a radio frequency arrangement having a plurality of antennas

Devices for testing a DUT having a circuit coupled to an antenna are disclose. The device can include a DUT location for receiving a DUT, and an adapter or probe is used to wirelessly 'over-the-air' (OTA) electronically test a DUT with an embedded antenna or antenna array with the measurement probelocated in close proximity to the DUT. The probe can be located very close to the DUT (e.g., in the near-field region). Although the probe is located in close proximity to the DUT antenna or antenna array elements it does not significantly disturb or interfere with probe during testing.

Test equipment for testing a device under test having an antenna

Devices for testing a DUT having a circuit coupled to an antenna are disclose. The device can include a DUT location, a probe, and a ground area configured to serve as an antenna ground area for the antenna of the DUT. The ground area includes a slot that the antenna feed impedance is not affected or not affected significantly. The probe is adapted to weakly couple to the antenna of the DUT via the opening to probe a signal when the antenna of the DUT is fed by the circuit of the DUT and/or in order to couple a signal to the antenna which is fed to the circuit of the DUT by the antenna.

Test equipment for testing a device under test having a circuit coupled to an antenna

The application provides an antenna element comprising a circuit board with a transmission line, the transmission line comprising at least a first conductor and a second conductor, a separate 3-dimensional, metallic or metallized ring-shaped structure mounted on a surface of the circuit board, a first galvanic contact between the first conductor and a first part of the separate 3-dimensional, metallic ring-shaped structure, and a second galvanic contact between the second conductor and a second part of the separate 3-dimensional, metallic ring-shaped structure, wherein at least one of the first galvanic contact and the second galvanic contact comprises at least two substantially L-shaped sections and an antenna array comprising several such antenna elements.

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Stuttgart, Germany

Jan Hesselbarth