X-rite Switzerland Gmbh

James William Vogh, Jr

Olivier Calas

Beat Frick

Niti Yadav

Leonel Fernando Mora

Jeremiah Snader

The present disclosure advantageously provides apparatus, systems and methods which facilitate estimating and accounting for illumination conditions, viewing conditions and reflectance characteristics for imaged surfaces when performing color measurement, correction and/or transformation in an imaging process, such as photography. Advantageously, the disclosed apparatus, systems and methods may utilize a set of one or more illumination target elements for extrapolating illumination conditions from an imaged scene. The disclosure may be used to improve determination of color correction/transformation parameters and/or to facilitate determining a reflectance model for a target surface of interest.

Imaging apparatus, systems and methods

Exemplary embodiments of the present disclosure are related to a color target and methods and systems for estimating a spectral reflectance of the color target based on an image of the color target. The color target can include a substrate having a target surface, a sample window formed in the substrate and defining perimeter within which a sample surface is disposed, and one or more filters disposed the sample surface. The one or more filters are configured to cover a first portion of the sample surface, while leaving a second portion of the sample surface uncovered.

Growing community of inventors

Boxford, MA, United States of America

James William Vogh, Jr