General Electric Company

James W Schuler

Kristina H Hedengren

Douglas S Steele

David W Oliver

Ralph Gerald Isaacs

Charles Robert Wojciechowski

Rudolph A Koegl

Joseph Czechowski, Iii

George Edward Williams

Joseph Manuel Portaz

John P Keaveney

John Robert Brehm

Theodore W Sippel

Joseph J Sostarich

Henry J Scudder, Iii

Thomas G Kincaid

Larry C Howington

James M Brown, Jr

Richard D Miller

An X-ray inspection system for manually or automatically performing digital fluoroscopy inspections and/or computed tomography inspections by X-ray examination of manufactured parts incorporates a computer system which automatically analyzes the inspected parts for flaws. The system includes apparatus for automatically positioning the parts in an X-ray machine for obtaining fluoroscopy and tomography views of the part and for acquiring data from the inspections at production rates. The system automatically identifies the location of rejectable flaws in the parts during the fluoroscopy scanning and subsequently identifies those locations for obtaining tomography scans, if the identified flaw location is questionable. The system can automatically reject parts containing flaws identified during the fluoroscopy inspections. This system operates in a real-time environment by providing analysis of one part while a subsequent part is being subjected to X-ray examination. The data obtained during each examination is archived and stored for tracking the part in further manufacturing processes.

X-ray inspection system

Growing community of inventors

Oxford, OH, United States of America

James W Schuler