Other

Hughes Aircraft Company

Northrop Grumman Systems Corporation

Trw Limited

Jawbone Innovations, LLC

Jawb Acquisition LLC

James T Hall

Thomas Alan Donaldson

Richard Noel Leyden

Ronald T Smith

John W Peters

Harvey N Rogers, Jr

Mark Winslow Johnson

Seymour Levine

James A Roth

Murty V Mantravadi

Dennis C Richman

Susan M Raffensperger

Arthur Bruce O'Connor

Dennis Hilliard Rose

Craig R Wilkinson

H Donald Wolpert

Frederick D Cottrell

Dennis G Neal

Steven Lai

Various embodiments relate generally to electrical and electronic hardware, computer software, wired and wireless network communications, and audio and speaker systems. More specifically, disclosed are an apparatus and a method for processing signals for optimizing audio, such as 3D audio, by adjusting the filtering for cross-talk cancellation based on listener position and/or orientation. In one embodiment, an apparatus is configured to include a plurality of transducers, a memory, and a processor configured to execute instructions to determine a physical characteristic of a listener relative to the origination of the multiple channels of audio, to cancel crosstalk in a spatial region coincident with the listener at a first location, to detect a change in the physical characteristic of the listener, and to adjust the cancellation of crosstalk responsive to detecting the change in the physical characteristic to establish another spatial region at a second location.

Listening optimization for cross-talk cancelled audio

Filter selection for delivering spatial audio

Spatial audio aggregation for multiple sources of spatial audio

This invention describes a device for testing a surface mounted connector using a test probe assembly that utilizes a vacuum to force the test wires and the test probe's wire array into intimate contact with the connector to be tested. The wires are directed through a wire module assembly and have a wide spacing at one end, and a narrow spacing corresponding to the spacing required for the specific units to be tested at the opposite end. The wires are kept in contact with the unit under test by the use of spring loaded test connectors and vacuum.

Device for testing surface mounted connectors

This invention describes a device for testing a surface mounted connector using a test probe assembly that utilizes a vacuum to force the test wires and the test probe's wire array into intimate contact with the connector to be tested.

Testing apparatus for surface mounted connectors

A passive thermal control blanket and a method for its manufacture, the blanket including a plastic substrate on which is deposited a film that is a homogeneous mixture of silicon and germanium, thereby combining the excellent reflective and electrostatic discharge properties of germanium with the superior adhesion and corrosion resistance properties of silicon. The uniform mixture is preferably obtained by sputtering the two materials simultaneously onto the substrate, using either separate targets, a single mosaic target, or a single composite target.

Mixed germanium-silicon thermal control blanket

A top plate release mechanism that comprises a sliding portion that forces locking tabs that are mounted in a mounting bracket to be dislocated to a releasing position, in order to allow a top plate to easily be removed from a probe plate assembly. The top plate release mechanism comprises biasing means to maintain the mechanism in a locked position until the sliding portion is moved. The top plate release mechanism may also comprise a locking feature that fixedly locks the release mechanism to prevent the locking tabs from prematurely returning to a locked position.

Top plate release mechanism

A method for determining the susceptibility of solar cell coverglass assemblies to degrade wherein the solar cell assembly contains coated or uncoated coverglass, the method comprises exposing the solar cell coverglass assembly with a pulsing laser having an energy per unit area per pulse which distinguishes by laser damage between coverglass assemblies that have an anomalously high propensity to darken under solar exposure and those that only have a normal, nominal propensity to darken; and, characterizing the propensity of the coverglass assemblies to darken. The process results in an improvement of the long-term power output of solar cells by maintaining optical transparency and reducing temperature increases arising from increased solar absorption in darkened coverglass assemblies.

Method for testing solar cell assemblies by ultraviolet irradiation for susceptibility to ultraviolet degradation

A method for determining the susceptibility of solar cell cover glass or second surface mirror to ultraviolet (UV) degradation comprises the steps of illuminating the solar cell cover glass with ultra violet light at a preselected illumination angle where the solar cell cover glass reflects a portion of the ultraviolet light; measuring the reflected portion of the ultraviolet light; and, characterizing the propensity of the cover glass or contaminate layer on a second surface mirror to degradation as a function of the reflectance. The process results in an improvement of the long-term power output of solar cells by screening out cover glasses that have a propensity to darken under solar-equivalent UV exposure and thus maintaining optical transparency arising from increased solar absorption in darkened cover glass. The process will additionally result in decreased contaminant levels on thermal control surfaces and less on-orbit degradation.

Method for testing solar cell assemblies and second surface mirrors by ultraviolet reflectometry for susceptibility to ultraviolet degradation

A scanner transmits a generally collimated beam of radiation such that the beam rotates about an axis to form a conical scanning pattern. The scanner comprises a concave parabolic reflector having a geometric axis and a focus, a rotation mechanism for effecting rotation of the concave parabolic reflector about a rotation axis which is angularly offset with respect to the geometric axis of the concave parabolic reflector, an opening formed in the concave parabolic reflector proximate the rotation axis thereof, and a convex parabolic reflector disposed along the rotation axis of the concave parabolic reflector and having a focus which is approximately co-located with the focus of the concave parabolic reflector. Directing collimated radiation through the opening formed in the concave parabolic reflector and onto the convex parabolic reflector while rotating the concave parabolic reflector about the rotation axis thereof effects transmission of a generally collimated beam of radiation such that the beam rotates about the rotation axis so as to form a conical scanning pattern.

Tilted primary clamshell lens laser scanner

A holographic optical element (HOE) includes a substrate structure having rotational symmetry with respect to a rotational axis for rotatively supporting at least two holograms. A first hologram on the substrate structure in the path of a normally incident beam diffracts the beam by a first acute angle and in a first radial direction from the rotational axis to a first redirected path. A second hologram on the substrate structure in the first redirected path diffracts the beam by a different second acute angle and in an opposite second radial direction from the rotational axis to a second redirected path. As a result, the two holograms may be used to achieve a second redirected path at an angle to the rotational axis that has a size which is the difference between the size of the first angle and the size of the second angle. The substrate structure may include first, second, and third disc-shaped substrates bonded together so that the third substrate is in between the first and second substrates, and a thin-film interference filter may be included on the third substrate to suppress zero-order leakage through the first hologram. The filter element may include one of a dielectric stack, a transmission hologram, or a reflectance hologram. The first hologram may be imprinted to achieve total internal reflection of zero-order leakage through the second hologram. An additional interference filter may be included on either the output face of the HOE or on a separate window element in order to reflects any zero-order leakage from the second hologram. The HOE may also have Schmidt-type aberration correction superimposed on at least one of the holograms to compensate for spherical aberrations from an all spherical Cassegrain type of telescope.

Holographic laser scanner and rangefinder

An error-compensated process for forming a multiple-notch optical filter which is characterized by a continually and accurately varying periodic profile. The optical medium if formed on a substrate so that the profile of the refractive index is multiply sinusoidally modulated to maintain Bragg's law for each component in the multiple-notch profile. In a preferred embodiment, as the optical medium is coated on the substrate, the depositing film is monitored by optical techniques, and feedback information is provided to a computer driven by a pre-programmed process control algorithm so that real time control of the manufacturing process may be accomplished.

Multiple-notch rugate filters and a controlled method of manufacture

A process for forming a single-notch optical filter having a continually and accurately varying periodic profile. An optical medium is coated on a uniform substrate where the homogeneous optical medium produces a rugate filter, so that the profile of the refractive index follows a sinusoidal pattern and Bragg's law. As the optical medium is coated on the substrate, the depositing film is monitored by optical techniques, and feedback information is provided to a computer driven by a pre-programmed process control algorithm so that real time control of the manufacturing process may be accomplished.

Single-notch rugate filters and a controlled method of manufacture

A process for forming on the surface of a substrate a layer of a siloxane polymer by exposing the substrate to a first vapor phase monomer precursor having the formula SiR.sub.x H.sub.4-x where x is 1 to 4 and R is alkyl or phenyl, and a second vapor phase oxygen-containing precursor in the presence of radiation of a predetermined wavelength to bring about the reaction to form the siloxane polymer which deposits on the surface of substrate. The monomer precursor may comprise a mixture, such as SiRH.sub.3 and SiR.sub.2 H.sub.2 with each other or with SiR.sub.3 H. By varying the composition of such mixtures, the composition of the siloxane polymer may be chosen to provide predetermined properties, and, further, may be varied throughout the thickness of the deposited layer.

Process for the photochemical vapor deposition of siloxane polymers

An improved process for depositing an oxide layer on a substrate by exposing the substrate to a selected vapor phase reactant and an oxygen-containing precursor comprising nitrous oxide mixed with molecular oxygen in a predetermined ratio, in the presence of radiation of a selected wavelength. The radiation causes the direct dissociation of the oxygen-containing precursor to form neutral oxygen atoms that react with the vapor phase reactant and form the oxide, which deposits as a layer on the substrate. The rate of reaction to form and deposit the oxide layer is enhanced by the mixing of molecular oxygen with nitrous oxide in the precursor.

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Torrance, CA, United States of America

James T Hall