Golden Oak Systems, Inc.

Nextest Systems Corporation

Gosys Inc.

James St Jean

David Reynolds

Michael Ferland

Edward Peek

Richard Carmichael

Clifford V Ludwig

Dan P Bullard

Eric N Parker

An automated test equipment (ATE) system includes a plurality of test blades each coupled to a test blade connector and mounted on a circular track; a central reference clock (CRC) having an origin point at a center of the circle; and a clock/sync connector coupled to the CRC through a zero skew clock connection to one or more sync buses, wherein each instrument utilizes the CRC to coordinate its testing process with another instrument.

Blade centric automatic test equipment system

A system and method for testing multiple smart card devices in parallel and asynchronously are provided. The system includes a smart card module that may be easily inserted in a digital test system. The smart card module includes multiple smart card instrument channels, each one of which testing a separate smart card device independently and asynchronously from the others. The smart card instrument channels employ a novel modulation technique based on palette waveforms that are formed of transitions between two data bits.

System for testing smart cards and method for same

Growing community of inventors

Meredith, NH, United States of America

James St Jean