Micron Technology Incorporated

James S Cullum

Jeffrey P Wright

Brent Keeth

Jeffery W Janzen

Timothy B Cowles

Victor Wong

Jeffrey W Janzen

Steven G Renfro

A system and method for decoding command signals that includes a command decoder configured to generate internal control signals to perform an operation based on the command signals and an operating state. The same combination of command signals can request different commands depending on the operating state. A command is selected from a first set of operations according to the command signals when the memory system is in a first operating state and a command is selected from a second set of operations according to the command signals when the memory system is in a second operating state.

System and method for decoding commands based on command signals and operating state

A dynamic random access memory ('DRAM') device includes a pair of internal address buses that are selectively coupled to an external address bus by an address multiplexer, and a pair of internal data buses that are selectively coupled to an external data bus by a data multiplexer. The DRAM device also includes a bank multiplexer for each bank of memory cells that selectively couples one of the internal address buses and one of the internal data buses to the respective bank of memory cells. Select signals generated by a command decoder cause the multiplexers to select alternate internal address and data buses responsive to each memory command received by the command decoder.

Memory device and method having multiple address, data and command buses

A method and apparatus are disclosed for adjusting the individual data hold time of data output buffers. Clock signals for the output buffers are respectively and individually adjusted for each of the output buffers to ensure a desired timing relationship among all of the data output by the buffers.

Method and apparatus for adjusting data hold timing of an output circuit

A semiconductor memory device including a memory-cell array divided into a plurality of memory sub-arrays that are arranged into rows and columns of memory cells. Each of the sub-arrays has a limited number of redundant rows and columns to repair defective memory cells. The redundant memory of at least two memory sub-arrays is coupled to an I/O line through a respective isolation circuit. A control circuit coupled to the isolation circuits selectively couples the redundant memory of the sub-arrays to the I/O line. Coupling the redundant memory of multiple sub-arrays facilitates using the redundant memory of one sub-array to repair the defective memory cells in other sub-arrays also coupled to the I/O line, when the redundant memory primarily associated with the other sub-arrays has been depleted.

Circuit and method for a multiplexed redundancy scheme in a memory device

A semiconductor memory device including a memory-cell array divided into a plurality of memory sub-arrays that are arranged into rows and columns of memory cells. Each of the sub-arrays have a limited number of redundant rows and columns to repair defective memory cells. The redundant memory of at least two memory sub-arrays are coupled to an I/O line through a respective isolation circuit. A control circuit coupled to the isolation circuits selectively couples the redundant memory of the sub-arrays to the I/O line. Coupling the redundant memory of multiple sub-arrays facilitates using the redundant memory of one sub-array to repair the defective memory cells in other sub-arrays also coupled to the I/O line, when the redundant memory primarily associated with the other sub-arrays have been depleted.

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Boise, ID, United States of America

James S Cullum