Dell USA L P

Other

Dell Products Inc.

James S Bell

Deepak N Swamy

Lonnie W Smith

Franklin D Tomlinson

Joseph A Vivio

Matthew Bruce Mendelow

Michael Vance Berry

Gita P Khadem

Scott H Estes

David Staggs

Patricia L Herman

Gregory D Orred

Richard I Phillips

Jakob Andrew Bell

Michael A Wason

A collapsible door frame with an extendable upper and lower fabric cover replaces a factory door for a JEEP&#xae; or other sport utility vehicle, providing the vehicle for operation with an open door frame with the application of the collapsible door frame and extension of an upper clear and lower fabric covering from a cross-frame member, the upper and lower covering attaching to the collapsible door frame to provide protection from adverse weather conditions.

Replacement Jeep&#xae; door frame and fabric cover

An accessory door panel for a utility vehicle provides a fabric door panel which can be quickly deployed and installed within a utility vehicle for emergency weather use where the utility vehicle has had the factory doors removed at the discretion of the driver. The fabric door panel is fitted to the contours of the door opening and may be stored from an overhead horizontal support member over the door or alternatively stored within a container mounted to the floor at the bottom of the door opening, the door being made of a flexible material that can be stretched across the door opening and anchored at several points along the door frame by independent anchors.

Accessory utility vehicle door panel

A collapsible door frame with an extendable fabric cover replaces a factory door for a sport utility vehicle, providing the vehicle for operation without a door while still allowing the drive to assemble and install the collapsible door frame and extend the fabric cover to provide protection from adverse weather conditions.

Collapsible door frame and fabric cover

A bowstring which is attached to a recurve or other long bow providing a section having an abrasive circular margin used to cut wood or other substance in an emergency replacing the bowstring of the bow utilized for shooting an arrow.

Bowstring saw

The disclosed apparatus relates to a stringed practice device comprising: a neck with an upper end and a lower end; a headstock coupled to the lower end of the neck; and where the headstock comprises a plurality of tuning posts. The disclosed method relates to a using a stringed practice device. The method comprises resting a headstock against a thigh of the user; and fingering the strings on a neck of the stringed practice device with one hand of the user.

Stringed practice device and method

A method for electronically encoding an article with work-in-progress information includes determining a work-in-progress condition of the article and setting an encoding device attached to the article to a set-point corresponding to the work-in-progress condition. Determining the work-in-progress condition includes identifying a present work-in-progress condition of the article and at least one historical work-in-progress condition of the article. Adjusting the encoding device includes adjusting the encoding device from a first set-point of a first set-point set to a first set-point of a second set-point set in response to passing a first work-in-progress evaluation, and adjusting the encoding device from the first set-point of the second set-point set to a second set-point of the first set-point set in response to failing a second work-in-progress evaluation after passing the first work-in-progress evaluation. The present work-in-progress information and historical work-in-progress information of the article are used to effectively estimate the reliability and improve the manufacturability of the article.

Apparatus and method for electronically encoding an article with work-in-progress information

An electrically conductive strap is connected to an electrically conductive first connector at one end and connected to an electrically conductive second connector at the other end. Both connectors are mounted on the substrate so that the connected strap extends over a portion of the mechanical component, or otherwise cooperates with the mechanical component, to secure the mechanical component in the desired position. Also, the connection between the strap and the first connector electrically couples the strap to the first connector while the connection between the strap and the second connector electrically couples the strap to the second connector. At least one of the connectors, the first connector for example, is also electrically coupled to a first reference voltage preferably available on the substrate. The electrical condition of the second connector may then be used to indicate whether the strap and therefore the mechanical component is in place on the substrate.

Apparatus and method for detecting a mechanical component on a computer system substrate

An apparatus is provided for retaining a production level device for use with an automated testing device for testing personal computer components. The apparatus includes an extrusion having a first portion for receiving the production level device and a second portion for attaching the extrusion to the automated test device. The apparatus also includes a moldable fastener for precisely fastening the production-level device to the first portion.

Apparatus and method for enabling auto-insertion of production level devices

A printed circuit board assembly testing device includes a LISN device connected to a power source and to a test enclosure. The test enclosure includes a power supply and a communication port. A signal analyzer is interfaced to the LISN device. A circuit board assembly unit under test is positioned in the test enclosure. A controlling computer is interfaced to the communication port. The controlling computer includes a hard disk storage device having benchmark data stored therein. A communication bus interconnects the controlling computer to the signal analyzer. The unit under test is powered up and emissions data is observed which correlates to activity in the unit under test. The emissions data is compared to the benchmark data and a determination can be made as to whether the observed data meets the benchmark data within an acceptable tolerance.

Method and apparatus for testing electronic systems using

A hold-down finger for holding a circuit board in a test fixture. The hold-down finger includes an attachment portion and a finger. The attachment portion is for attaching the hold-down finger to the test fixture. The attachment portion has a central axis. The finger is coupled to the attachment portion at a location displaced from the central axis of the attachment portion. Displacing the finger from the central axis allows for the tip of the finger to be located more precisely in a radial manner about the center point of the device to hold a circuit board down against the extreme pressures of test probe springs.

Rotatable mechanical hold-down finger for holding a circuit board in a

A test apparatus and method for fully testing the functional aspects of a computer system at the system level through one or more of its I/O ports. A test system is connected to an externally available I/O port of the computer under test for accessing its system ROM and a jumper is installed on the computer under test to disable its system ROM. The jumper also bypasses the PCMCIA controller, if necessary, to provide the test system direct access to the I/O port and thus the system ROM. The computer under test is booted from diagnostic test code stored in memory of the test system, where the diagnostic test code has complete control and performs a series of tests on the computer under test. Other I/O ports of the computer under test, including its serial ports, parallel port, keyboard and mouse ports, video port and a docking port may also be connected to the test system, if desired. Certain portions of the diagnostic test code may be downloaded into video RAM of the computer under test and executed sequentially. Also, a communication protocol may be established between the host computer and the computer under test so that the host computer can control initiation and monitor status of each test routine.

System level functional testing through one or more I/O ports of an

The present invention is directed to a device for securing an electrical component to a pin grid array (PGA) socket that has a substantially planar body portion and a plurality of conductor pins, which are electrically connectable to a circuit board and project outwardly in a direction substantially perpendicular to the planar body portion. The device comprises a base member that has a plurality of conductor pin apertures which extend through the base member. Each of the conductor pin apertures are registered to receive therethrough a corresponding one of the plurality of conductor pins, to thereby sandwich the base member between and anchor the base member to the circuit board and the PGA socket when the PGA socket is electrically connected to the circuit board. The device further comprises a retainer for releasably securing the electrical component to the PGA socket. The retainer is coupled to the base member and a surface of the electrical component and transmits a retaining force from the base member to the electrical component, thereby substantially preventing the electrical component from separating from the PGA socket.

Method for securing an electronic component to a pin grid array socket

An improved test probe for use with a bed of nails type test fixture is disclosed. The test probe comprises a probe body having a test head at one end for contacting test points on a DUT placed in a test fixture and an annular ring disposed around the circumference thereof proximate the center of the probe. A nonconductive tubular sheath is disposed over the test head and affixed at one end to the test probe by the annular ring. The other end of the sheath extends beyond the test head such that the test head is recessed within the sheath a distance defined by component lead length and PCB thickness fault tolerances and acceptable float. In this manner, the test probe enables the detection of PCB faults caused by missing or improperly or incorrectly inserted plated through-hole mounted components.

Test probe for computer circuit board test fixture

A rework configuration is provided for disconnecting defective lithography-formed conductors and/or overlying electrical components from the printed circuit wiring netlist and connecting rework elements at the substituted sites. In particular, defective regions can be severed at spaced first and second target areas the upper surface of the PCB and one or more interconnect structures can be coupled therebetween. The interconnect structures allow re-routing of PCB conductors, allow connectivity between the upper and lower surfaces, allow connectivity to power and ground planes, and allow pull-up, pull-down and decoupling connectivity.

Growing community of inventors

Cedar Park, TX, United States of America

James S Bell