Sri International

James R Potthast

David S Stoker

Erik Frank Matlin

Neil William Troy

Motilal Agrawal

A method and apparatus for scanning an integrated circuit comprising a plurality of time-synchronized laser microscopes, each of which is configured to scan the same field of view of an integrated circuit under test that generates a plurality of images of the integrated circuit under test, a data processor, coupled to the laser scanning microscope, for processing the plurality of images, comprising, a netlist extractor (NE) that produces one or more netlists defining structure of the integrated circuit under test.

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San Jose, CA, United States of America

James R Potthast