Agilent Technologies, Inc.

James R Medunick

Russell A Clegg

Michael Joseph Benes

A high speed multiple range measurement system that selects on a sample by sample basis the range having the highest resolution and accuracy for which an overload condition does not exist. A plurality of analog to digital converters sample and convert an analog of a physical quantity, such as voltage, current, temperature, strain etc. to a plurality of digital data steams, each having a full scale range representing a fraction of an expected maximum value of the physical quantity. Corresponding overload detectors test the respective data streams for an overload condition. A data selector chooses the data stream having a full scale representing the smallest fraction of an expected maximum value based on the overload detector status.

High speed measurement system which selects optimal measurement range on a sample by sample basis

An apparatus for and a method of making very accurate non-invasive current measurements of current flowing from a power source to a device under test (DUT). A power supply, which operates in a pass through mode and which incorporates a plurality of sense leads, compensates for voltage drops due to system wiring and measurement shunts within the bandwidth limits of the power supply. The resulting circuit voltage and impedance seen by the load, after the addition of the measurement system and system wiring, is nearly identical to the power source's output voltage and impedance.

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Newton, NJ, United States of America

James R Medunick