University of Hawai'i

James R Gaines

Anupam Kumar Misra

Richard E Rocheleau

Steven Y Song

Steven Song

The present invention is a novel electronic technique that detects stress/strain in any conductive or semiconductive material. The technique is based on passing a current through the material of interest and analyzing the low frequency voltage fluctuation. The voltage fluctuation is very sensitive to the amount of stress present in the sample. The voltage fluctuation is a result of interactions between the imposed current and material itself. The technique is many orders of magnitude more sensitive than any present method. The technique is suitable for sensitive measurements without a strain gauge. The technique is not limited by sample size, and provides a simple, fast, nondestructive and on-site evaluation of stress/strain in a material.

Stress induced voltage fluctuation for measuring stress and strain in

A melt textured growth process for bulk YBCO at temperatures below 950.degree. C. is provided so that the material (YBCO) can be combined with silver to produce bulk superconductors by providing a combination of precursors that provide melting at 950.degree. C. or lower temperatures. After melting of the thoroughly mixed precursors, the sample is cooled in a controlled temperature environment. The process makes it possible to use metallic silver or other normal metals such as gold, as components in the fabrication of long YBCO wires and cables while achieving a high critical current density.

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Honolulu, HI, United States of America

James R Gaines