Lexmark International, Inc.

James Patrick Sharpe

James Ray Bailey

Christopher Wilson Case

James Alan Ward

Michael Anthony Marra, Iii

Nathan Wayne Foley

Keith Allen Wahnsiedler

A system for testing or debugging a device under test having an embedded logic analyzer. In one embodiment, the system includes software stored in non-transitory memory for testing a device under test having an embedded logic analyzer, the software program product having instructions which, when executed by a computing device associated with the device under test cause the computing device to reconstruct signals of interest in the device under test based at least in part upon signals captured by the embedded logic analyzer during the test or debug session, and cause the computing device to display the reconstructed signals of interest to a user of the computing device.

System and method for analyzing an electronics device including a logic analyzer

An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefore. In one embodiment, an integrated circuit includes a logic analyzer having a first input receiving a plurality of signals and an output for providing an indication of a detection, by the logic analyzer, of at least one trigger event; and a built in self test block having a first input for receiving one or more of the signals appearing at the first input of the logic analyzer, a second input coupled to the output of the logic analyzer for selectively enabling the BIST block, the BIST block generating and maintaining a signature based upon the first and second inputs thereof.

Integrated circuit including a programmable logic analyzer with enhanced analyzing and debugging capabilities and a method therefor

Disclosed is a method for tuning control signals associated with one or more memory devices. The method includes performing a number of memory access operations on at least one memory device and recording results of the memory access operations. Specifically, the memory access operations are performed with different time delays for a first edge of a control signal. The control signal used for capturing data is provided by the at least one memory device. The method further includes selecting a time delay from the time delays used in the memory access operations. Moreover, the method includes utilizing the selected time delay in performing subsequent memory access operations on the at least one memory device. Also disclosed is a system including at least one memory device and an integrated circuit operatively coupled to the at least one memory device. The system incorporates the method for tuning control signals.

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Lexington, KY, United States of America

James Patrick Sharpe