Advanced Micro Devices Corporation

James M Buchanan

Stephen C Horne

Scott H McMahon

Russell A Hershbarger

Ronald F Talaga, Jr

The present invention encompasses the use of multiple feedback paths in a clock source for an integrated circuit device to maintain phase lock to an external clock. It is further contemplated by the present invention that feedback paths are provided from the internal clock distribution path and from a matching path that approximates the delay of the clock distribution path. The matching path may comprise a delay locked loop. Feedback from the clock distribution path is used in normal operation and feedback from the matching path is used when the internal clock distribution path is disabled. The clock source of the present invention also may implement power management functions.

Clock generator with multiple feedback paths including a delay locked

A variable strength clock signal driver circuit and method of manufacturing the same are provided that accommodate either full or reduced drive strength of a generated clock signal. The clock driver circuit includes a package bonding option to select the desired strength of drive. Thus, the clock driver circuit may be operated at either fast or slow clock frequencies as determined by the system requirements. As a result, both high performance, high drive versions and low cost, low drive versions of a digital circuit such as a microprocessor may be provided that differ only in package bonding. The same set of masks may be used to produce either version of the circuit, thus permitting greater manufacturing flexibility and reducing cost. Furthermore, electromagnetic interference may be reduced by selecting the low drive strength option for cost sensitive applications.

Variable strength clock signal driver and method of manufacturing the

A method for testing of an integrated circuit of a semiconductor device which is packaged in a housing with leads projecting from the housing and contact elements, other than leads, disposed along one or more of the surfaces of the housing is disclosed. A plurality of decoupling capacitors are mounted on a printed circuit board and disposed for being temporarily connected to the contact elements during testing of the integrated circuit at an automatic handler test station, wherein a test environment is created which closely approximates a real operating environment of the integrated circuit.

Method of testing an integrated circuit within an automated handler

Disclosed is a method and apparatus for the testing of an integrated circuit which is packaged in a housing with leads projecting from the housing and contact elements disposed along one or more of the surfaces of the housing. In the apparatus a plurality of electrical or electronic devices may be temporarily connected to the contact elements during testing of the integrated circuit at an automatic handler test station.

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Austin, TX, United States of America

James M Buchanan