International Business Machines Corporation

James K Tam

Paul William Coteus

Warren Edward Maule

Alphonso Philip Lanzetta

Gerard Vincent Kopcsay

Alina Deutsch

James D Wagoner

Daniel J Phipps

Gnanalingam Arjavalingam

Ralph Herman Genz

A data processing system including an improved method and apparatus for the arrangement and interconnection between electronic devices to improve system cycle time. The apparatus possesses a) a plurality of: memory SIMMs, memory devices on the noted memory SIMMs and registers; b) a clock; c) means for connecting signals between the memory devices on the memory SIMMs and the registers; and d) means for connecting signals between the memory devices on the memory SIMMs and the clocks.

Clustered, buffered simms and assemblies thereof

A method for completely characterizing coupled transmission lines by short-pulse propagation is described. The complex frequency-dependent propagation matrix, impedance matrix and admittance matrix for a set of n parallel transmission lines can be determined by comparing the properties of two sets of coupled transmission lines of different length. Each transmission line set has two conductors of unequal length and ground conductors to form a coupled transmission line system. Each transmission line set can have uncoupled ends. An input pulse is provided at at least one node of each transmission line set. The complex frequency dependent propagation matrix of each transmission line set is determined by a comparison of the output pulses at the remaining nodes of each transmission line set which involves ratioing to cancel out the effect of the pad-to-probe discontinuity and the uncoupled ends which make it unnecessary to do any embedding. For a transmission line wherein the dielectric loss is negligible, the complex frequency dependent characteristic admittance can be determined from the propagation matrix and the empirically determined capacitance matrix. For a transmission line wherein the resistive loss is negligible, the frequency dependent characteristic impedance matrix can be determined from the propagation matrix and the empirically determined inductance matrix. Specific structures are used with the measurement method to determine these coupled transmission line parameters. The method is particularly useful to determine these parameters for transmission lines in semiconductor chip packaging substrates.

Methods for the measurement of the frequency dependent complex

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Shrub Oak, NY, United States of America

James K Tam