Bayer Corporation

James J Childs

Ronald S Scharlack

A method of performing analysis of samples having turbidity and/or high absorbance is disclosed. The analysis utilizes information from multiple factors, which affect transmittance or absorbance. These factors include: absorbance as measured in a non-turbid sample, scattering losses due to particles and limitations of the measurement device as measured in a non-absorbing sample, additional scattering losses due to sample absorbance, variable path length effects due to the sample, variable path length effects due to the measurement device, and additional nonlinear effects. By taking into account additional factors that affect transmittance or absorbance, a more accurate analysis is achieved.

Method and apparatus for performing spectroscopic analysis with applicability to samples with turbidity and absorption

A method for analysis of samples having turbidity and/or high absorption is disclosed. The analysis incorporates several factors that affect transmittance or absorption. These factors may include: absorption as measured in a non-turbid sample, scattering losses due to particles and limitations of the measurement device as measured in a non-absorbing sample, additional scattering losses due to sample absorption, variable path length effects due to the sample, and variable path length effects due to the measurement device. By taking into account additional factors that affect transmittance or absorption, a more accurate analysis is achieved.

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Franklin, MA, United States of America

James J Childs