Honeywell International Inc.

Other

James Douglas Seefeldt

Weston Roper

Cheisan J Yue

Xiaoxin Feng

Bradley A Kantor

Paul S Fechner

Keith W Golke

Jeffrey James Kriz

Mark Daniel Dvorak

James G Hiller

James K Hansen

This disclosure is directed to devices, integrated circuits, systems, and methods for implementing an internal body tie bias circuit in a CMOS logic circuit. In one example, a CMOS logic circuit is formed in an integrated circuit. The CMOS logic circuit includes a PMOS transistor, an NMOS transistor; and a body tie bias circuit formed in the integrated circuit. The body tie bias circuit is coupled between a body tie connection terminal of the PMOS transistor and a body tie connection terminal of the NMOS transistor.

CMOS logic circuit using passive internal body tie bias

This disclosure is directed to techniques for preventing or reducing perturbations of an output signal of a differential amplifier caused by ionizing radiation incident upon the amplifier. The amplifier may include an amplification module that includes a plurality of amplification units configured to amplify a difference between a first component and a second component of a differential voltage signal to generate a plurality of amplified difference signals each corresponding to the amplified difference. The amplifier may further include a combination module that combines the plurality of amplified difference signals to generate a common output signal corresponding to the amplified difference.

Radiation hardened differential amplifier

A process, voltage, and temperature (PVT) compensation circuit and a method of continuously generating a delay measure are provided. The compensation circuit includes two delay lines, each delay line providing a delay output. The two delay lines may each include a number of delay elements, which in turn may include one or more current-starved inverters. The number of delay lines may differ between the two delay lines. The delay outputs are provided to a combining circuit that determines an offset pulse based on the two delay outputs and then averages the voltage of the offset pulse to determine a delay measure. The delay measure may be one or more currents or voltages indicating an amount of PVT compensation to apply to input or output signals of an application circuit, such as a memory-bus driver, dynamic random access memory (DRAM), a synchronous DRAM, a processor or other clocked circuit.

Apparatus and method for compensating for process, voltage, and temperature variation of the time delay of a digital delay line

Method and system for aligning a clock signal to parallel data are described. According to one embodiment, a clock shifting circuit shifts an incoming clock signal relative to an incoming data signal, and a data clocking circuit uses the shifted clock signal to reclock the incoming data signal. The clock shifting circuit may comprise a phase locked loop (PLL) coupled with multiple D flip flops (DFFs) connected in series. Divisional combinatorial logic may be disposed between DFFs in the series. Data clocking circuits may comprise one DFF to reclock each incoming data bit, a pair of DFFs to reclock each incoming data bit, or other circuits such as true-complement blocks to serve as local oscillators to mixers. Multiple shifted clock signals may be produced, such as those shifted 60, 90, 120, 180, 240, and 270 degrees relative to the incoming clock signal.

Circuit for aligning clock to parallel data

A radiation-hardened charge pump circuit is provided. The circuit includes a first charge pump having a first charge pump output, a second charge pump having a second charge pump output, a first coincidence detector receiving as inputs the first charge pump output and the second charge pump output and producing as an output a first coincidence signal, and an analog 2:1 multiplexor for selecting either the first charge pump output or the second charge pump output based on the first coincidence signal. In alternative embodiment, the circuit includes at least three charge pumps, at least two coincidence detectors, decision logic, and a correspondingly-sized analog multiplexor.

Radiation-hardened charge pump topology

An integrated circuit has a buried insulation layer formed over a semiconductor substrate, and a semiconductor mesa formed over the buried insulation layer. A low resistivity guard ring substantially surrounds the semiconductor mesa and is in contact with the semiconductor substrate. The low resistivity guard ring is grounded and isolates the semiconductor mesa from RF signals.

Techniques to reduce substrate cross talk on mixed signal and RF circuit design

Described herein are methods and apparatuses for achieving a desired duty cycle on an output of a PLL. According to one embodiment, a method is described, including generating a single ended clock signal from a differential common mode clock signal using a limiting differential amplifier, wherein the single ended clock signal has a duty cycle, generating a differential bias current signal in response to the duty cycle of the single ended clock signal, and correcting the duty cycle of the single ended clock signal to a desired duty cycle by applying the differential bias current signal to the limiting differential amplifier. According to another embodiment, a CML-to-CMOS converter circuit is described, including a limiting differential amplifier for generating a single ended clock signal from a differential common mode clock signal, wherein the single ended clock signal has a duty cycle, a low-pass filter for generating a measurement of the duty cycle of the single ended clock signal, and a second differential amplifier for (i) comparing the measurement with a reference voltage and (ii) generating a differential bias current signal in response to the comparison.

Method and apparatus for achieving 50% duty cycle on the output VCO of a phased locked loop

In general, this disclosure is directed to a duty cycle correction (DCC) circuit that adjusts a falling edge of a clock signal to achieve a desired duty cycle. In some examples, the DCC circuit may generate a pulse in response to a falling edge of an input clock signal, delay the pulse based on a control voltage, adjust the falling edge of the input clock signal based on the delayed pulse to produce an output clock signal, and adjust the control voltage based on the difference between a duty cycle of the output clock signal and a desired duty cycle. Since the DCC circuit adjusts the falling edge of the clock cycle to achieve a desired duty cycle, the DCC may be incorporated into existing PLL control loops that adjust the rising edge of a clock signal without interfering with the operation of such PLL control loops.

Automatic control of clock duty cycle

A radiation sensor and a method for making the radiation sensor are described. An ionizing radiation sensitive area is formed in a radiation insensitive or hardened die. When the sensitive area is impacted by ionizing radiation, properties of the sensitive area change. For example, the changed property may be charge density, threshold voltage, leakage current, and/or resistance. Circuitry for measuring these property changes is located in a radiation hardened area of the die. As a result, a radiation sensor may be fabricated on a single die.

Passive solid state ionizing radiation sensor

A differential charge pump with common mode and active regulators is presented. Either type of regulator may be used to improve the performance characteristics of the differential charge pump. The active regulator increases the output range of the differential amplifier. The common mode regulator establishes the common mode voltage of the differential charge pump. The common mode voltage is established independently from external circuitry and does not use a feedback path. The common mode regulator may also be used to establish a mid-rail voltage, which may be used to further improve the output range of the differential amplifier.

Differential charge pump with open loop common mode

A system and method for generating a reset signal within a Phase Locked Loop (PLL) circuit is described. The reset signal is generated by inputting a reference signal and a lock detect signal into reset circuitry. The reset circuitry within the PLL comprises a series of interconnected latches, or D flip-flops, which are used to create a delay time. The delay time is the amount of time the reset circuit will wait until the reset signal indicates a reset. The reset circuit may also generate a reset signal having a pulse width. The pulse width is determined by the series of interconnected latches. The reset signal may be used to reset a Voltage Controlled Oscillator (VCO) or other circuits within a PLL or it may be used by circuits external to the PLL.

Circuit to reset a phase locked loop after a loss of lock

An apparatus and method for providing a stable gain over wide frequency range in a VCO are presented. A VCO uses a waveform generator along with a bias generator having a frequency select input. The frequency select input is used to adjust the amount of output current and/or gain of the bias generator. The output current of the bias generator determines the frequency of the output of the waveform generator. Multiple bias and waveform generators may be used to expand the frequency range of the VCO. A PLL may be programmed for a variety of output frequencies by using the frequency select input of the VCO.

Voltage-controlled oscillator with stable gain over a wide frequency range

An improved system and method for determining the lock condition of a Phase Locked Loop (PLL) is described. The lock detect circuit generates a fast lock detect signal that may be used to detect a transient loss of lock. The lock detect circuit may also include a phase alignment detect circuit to detect a misalignment in the phase of a reference clock and a feedback clock. Additionally, the lock detect circuit may include a reference clock detect circuit to detect if the reference clock signal is detected. Output signals from all of the above circuits may be communicated to a logic circuit in order to create an enhanced lock detect signal. An extended lock detect signal may also be communicated to the logic circuit.

Lock detect circuit for a phase locked loop

An apparatus and method for providing a power supply compensated voltage or current is presented. A supply compensated current and voltage source utilizes a differential amplifier connected to a bandgap reference voltage and a scaled power supply voltage. When power supply varies, the differential amplifier regulates a stable compensated output. The output may be a compensated voltage or current. In addition, multiple currents and voltages may be referenced from the differential amplifier. The stable compensated output may be supplied as a reference bias for external circuitry. In addition, the compensated output may be supplied to a voltage controlled oscillator.

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Eden Prairie, MN, United States of America

James Douglas Seefeldt