Growing community of inventors

Albuquerque, NM, United States of America

James Copland

Average Co-Inventor Count = 2.99

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 94

James CoplandDaniel Ralph Neal (4 patents)James CoplandThomas Daniel Raymond (4 patents)James CoplandStephen W Farrer (4 patents)James CoplandWei Xiong (2 patents)James CoplandLyle Kordonowy (2 patents)James CoplandCharles E Campbell (1 patent)James CoplandPaul D Pulaski (1 patent)James CoplandWilliam Shea Powers (1 patent)James CoplandJeff Kolberg (1 patent)James CoplandXifeng Xiao (1 patent)James CoplandAlan Blair (1 patent)James CoplandPaul Pulaski (1 patent)James CoplandJames Copland (7 patents)Daniel Ralph NealDaniel Ralph Neal (76 patents)Thomas Daniel RaymondThomas Daniel Raymond (57 patents)Stephen W FarrerStephen W Farrer (31 patents)Wei XiongWei Xiong (16 patents)Lyle KordonowyLyle Kordonowy (3 patents)Charles E CampbellCharles E Campbell (42 patents)Paul D PulaskiPaul D Pulaski (15 patents)William Shea PowersWilliam Shea Powers (6 patents)Jeff KolbergJeff Kolberg (4 patents)Xifeng XiaoXifeng Xiao (3 patents)Alan BlairAlan Blair (2 patents)Paul PulaskiPaul Pulaski (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Amo Wavefront Sciences, LLC (5 from 59 patents)

2. Wavefront Dynamics, Inc. (2 from 7 patents)


7 patents:

1. 12285214 - Wide-field multi-axis aberrometer

2. 12220170 - Aberrometer with a dynamically adjustable video fixation target

3. 8730463 - Method of verifying performance of an optical measurement instrument with a model eye and an optical measurement instrument employing such a method

4. 8260024 - Systems and methods for measuring surface shape

5. 8126246 - Systems and methods for measuring surface shape

6. 7988290 - Systems and methods for measuring the shape and location of an object

7. 7967440 - System and method for characterizing corneal surfaces

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12/7/2025
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