Microsanj, LLC

University of California

Sunrise Medical Gmbh

James Christofferson

Ali Shakouri

Hamid Reza Piroozi

Dustin Kendig

Peyman Milanfar

Kenneth D Pedrotti

An infrared (IR) digital lens (IR Objective) for an optical microscope is disclosed which includes a body, configured to be mounted to an objective interface of an optical microscope, an IR camera disposed in the body, the IR camera configured to receive light in the range of IR and capture images from a specimen disposed under the body without the need to move the specimen from the optical microscope.

Microscope mounted infrared digital thermal image system

A method for determining change in temperature of an electromagnetically radiating device between un-energized and energized states without contacting the device is disclosed. The method includes establishing a reference image form the device by illuminating the device with an optical signal having a first optical characteristic and capturing the reference image from the device in an un-energized state, establishing an on image form the device by illuminating the device in an energized state, and establishing a modified on image form the device by illuminating the device in the energized state with a modified optical signal having a third illuminating optical characteristic, and comparing the reference image, the on image, and the modified on image to establish changes in reflection as a result of changes in temperature of the device during energization.

Method and system for thermal imaging with optical emissions from a device under test

Methods and apparatus for non-contact thermal measurement which are capable of providing sub micron surface thermal characterization of samples, such as active semiconductor devices. The method obtains thermal image information by reflecting a light from a surface of a device in synchronous with the modulation of the thermal excitation and then acquiring and processing an AC-coupled thermoreflective image. The method may be utilized for making measurements using different positioning techniques, such as point measurements, surface scanning, two-dimensional imaging, and combinations thereof. A superresolution method is also described for increasing the resultant image resolution, based on multiple images with fractional pixel offsets, without the need to increase the resolution of the image detectors being utilized. The thermoreflective method provides a spatial resolution better than current infrared cameras, operates within a wide temperature range, and is capable of a thermal resolution on the order of 10 mK&#xb0;.

Submicron thermal imaging method and enhanced resolution (super-resolved) AC-coupled imaging for thermal inspection of integrated circuits

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Santa Cruz, CA, United States of America

James Christofferson