Delphi Technologies, Inc.

Aptiv Technologies Limited

Delphi Technologies IP Limited

James C Baar

Robert R Bugher

Timothy D Garner

Ronald Melvin Taylor

Yew Kwang Low

Michael Wayne Blazier

Benjamin Dilsaver

Michael D Cervoni

Raul Alfonso Zubia Duran

Piotr Szewc

Az Eddine Farouki

Chad M Blueher

Gerald Stier

Jason L Shahan

Jason S Landrum

Nathan R Faulks

Steven D Kaufman

Scott E Stoerger

Raul Alfoso Zubia Duran

An illustrative example embodiment of a camera testing device includes a plurality of optic components in a predetermined arrangement that places a center of each of the optic components in a position to be aligned with a line of sight of a respective, predetermined portion of a camera field of view when the plurality of optic components are between the camera and at least one target.

Optics device for testing cameras useful on vehicles

A detector testing system includes an environmental chamber configured to provide at least one selected environmental condition within the chamber. The environmental chamber includes an opening. A cover over the opening has at least one surface that is at least partially transparent to radiation that the detector is configured to receive. The cover is configured to maintain the at least one selected environmental condition within the environmental chamber. A detector support is configured to support a plurality of detectors exposed to the at least one selected environmental condition in a location within a space defined by the cover where the cover provides a detector field of view through the at least one surface. The detector field of view for each of the detectors has a horizontal range of at least 180&#xb0;.

Testing system for detectors useful on vehicles

A system for testing electromagnetic compatibility of electrical devices includes a plurality of mobile-ground-planes and a fixed-ground-plane. Each of the plurality of mobile-ground-planes is individually customizable to provide a test-fixture for testing a selected instance of an electrical device. The fixed-ground-plane is configured to receive an instance of the plurality of mobile-ground-planes to overlay the fixed-ground plane and form a direct electrical contact between a bottom-side of the instance of the plurality of mobile-ground-planes and a top-side of the fixed-ground-plane. Optionally, the system includes an air-nozzle used to generate an air-gap between the instance of the plurality of mobile-ground-planes and the fixed-ground-plane while the instance of the plurality of mobile-ground-planes is being placed onto the fixed-ground-plane when gas passes through the air-nozzle.

Electromagnetic compatibility test system with fixed and mobile ground planes

A cold-test system for testing a camera at a cold temperature includes a test-chamber with a window, a nozzle, and a recirculator. The window is installed in the test-chamber so the camera is provided with a view of a test-target outside of the test-chamber. The nozzle is located proximate to a first edge of the window. The nozzle is configured to direct air from an air-source in a first direction and adjacent to an outside-surface of the window. The recirculator is located proximate to a second edge of the window opposite the first edge. The recirculator is configured to receive the air moving in the first direction and re-direct that air in a second direction opposite the first direction and adjacent to the air moving in the first direction opposite the window. The nozzle and the recirculator cooperate to form a bi-directional air-curtain proximate to the outside-surface.

Bi-directional air-curtain for cold testing a camera

Integrated circuit moisture resistant apparatuses () are provided for preventing moisture absorption by an integrated circuit (). The moisture resistant apparatuses include at least one integrated circuit housing () that has a plurality of inner walls (), which form at least one inner cavity (). A desiccant body () is coupled to at least a portion of the plurality of inner walls () and absorbs moisture within the inner cavity (). A method for performing the same is provided. Also, a manufacturing method of preventing moisture absorption by the integrated circuit () is provided.

Moisture-sensitive device protection system

Growing community of inventors

Logansport, IN, United States of America

James C Baar