Raytheon Company

James Bynes, Iii

William Rowe

Alfredo Rene Lara

Dale D Kachuche

Mustafa Amin

Brian Clebowicz

Patrick Fleming

Patrick Llorens

Neal Pollack

Fault injection testing for field programmable gate array (FPGA) devices including: interfacing with a FPGA device under test (DUT); imaging a configuration RAM (CRAM) of the FPGA DUT with a first configuration image to define a first operational function of the FPGA DUT where the CRAM includes a plurality of CRAM bits, injecting a plurality of single event upsets into a portion of the plurality of the CRAM bits while the FPGA DUT is operating; concurrently monitoring operations of the FPGA DUT and a reference FPGA device; comparing outputs of the FPGA DUT with outputs of the reference FPGA device during concurrent operations, and if there is a mismatch between the outputs of the FPGA DUT and the reference FPGA, determining that error events have occurred within the FPGA DUT; and storing the error events and CRAM location data associated with corresponding single event upsets in an error log.

Methods and systems for single-event upset fault injection testing

Growing community of inventors

El Segundo, CA, United States of America

James Bynes, Iii