Qualitau, Inc.

Other

Instrumems, Inc.

James Borthwick

Peter P Cuevas

Gedaliahoo Krieger

Tal Raichman

Jens Ullmann

Jose Antonio Chavez

Gilad Arwatz

Michael A Casolo

Jeffrey Diament

Numerous embodiments of a bubble detection apparatus and method are disclosed. In one embodiment, a bubble detection module is placed into a liquid to be monitored. The module comprises a physical structure housing a nanowire sensing element. The liquid flows through the physical structure. An electric bias is placed across the nanowire sensing element, and the resistance of the nanowire sensing element changes when a bubble is in contact with the element. A change in voltage or current of the bias signal can be measured to identify the exact instances when a bubble is in contact with the nanowire sensing element.

Bubble detection module comprising a nanowire

A voltage limiting circuit for limiting the voltage developed across a current sensing circuit and a method are disclosed. The voltage limiting circuit includes an input terminal configured to receive an input signal from the current sensing circuit, and an output terminal configured to receive an output signal from the current sensing circuit. A voltage sense circuit is connected to the input terminal and output terminal to detect that a predefined threshold voltage is developed between the input terminal and output terminal. An activation circuit receives a signal from the voltage sense circuit to activate the voltage limiting circuit, and a level shifting circuit interfaces the voltage sense circuitry to the activation circuitry and other circuits by level shifting signals to required levels.

System and method for limiting voltage

An external electrical power distribution apparatus and method for adding electrical power distribution to the exterior of a building are disclosed. The external electrical power distribution apparatus includes a base configured to be mounted to a support structure on one side and further configured such that an electrical device can be mounted on a different side than the side mounted to the support structure. The base includes electrical power distribution outlets housed within it, and the housing also includes electrical wiring for providing electrical power to the electrical device and electrical power distribution outlets.

External electrical power distribution apparatus

A signal distribution apparatus for distributing a stress signal to a plurality of devices under test (DUTs) is disclosed. The distribution apparatus includes a single input that receives the stress voltage signal to be distributed, a plurality of outputs that distribute the stress voltage signal to the plurality of DUTs, and a plurality of integrated current limiter and switch circuits. Each integrated current limiter and switch circuit connects a DUT of the plurality of DUTs to the single input through one of the plurality of outputs, and includes at least one combined switching and current limiting element.

Signal distribution apparatus

Pulsed current circuitry for electromigration testing of semiconductor integrated circuits and components. The circuit includes a multiplexer that outputs analog voltage pulses, and is capable of generating both bipolar and unipolar voltage pulses. At least one operational amplifier and resistor receive the voltage pulses from the multiplexer and convert the voltage pulses to current pulses. A charge booster circuit is provided for minimizing overshoots and undershoots during transitions between current levels in the test circuit.

Pulsed current source with internal impedance matching

A current source is provided with two resistor banks, and digital potentiometers are used to control how much each resistor bank affects the resulting output current. Furthermore, when the digital potentiometers are at a particular setting such that a particular resistor bank does not affect the resulting output current (i.e., the resistor bank is 'inactive'), the resistance of that resistor bank can be switched without affecting the output current, thus minimizing or eliminating discontinuities in the output current during a current sweep operation. Thus, for example, when a resistor bank meets its threshold and becomes inactive, the resistance of the inactive resistor bank may be switched, and then the digital potentiometer setting may be changed to facilitate smoothly reactivating that resistor bank, with the new resistance.

Modified current source (MCS) with seamless range switching

A dual channel source measurement unit for reliability testing of electrical devices provides a voltage stress stimulus to a device under test and monitors degradation to the device under test caused by the stress simulator. The dual channel source measurement unit decouples the stress and monitor portions of the unit so that the requirements of each can be optimized. Deglitching and current clamp switches can be incorporated in the dual channel source measurement unit to prevent glitches in the switching circuitry and to limit or clamp current flow to or from the monitor and stress sources.

Dual channel source measurement unit for semiconductor device testing

In an electrical circuit for testing electrical current using a plurality of precision resistors connected in parallel or in series, a range finder for receiving the current to be measured with the voltage drop across the range finder being indicative of a current sub-range for measurement. In a preferred embodiment, a range finder has a first bipolar transistor and a second bipolar transistor connected in parallel and in opposite polarity with the emitter and base of each transistor connected together whereby each transistor functions as an emitter-base diode.

Growing community of inventors

Santa Clara, CA, United States of America

James Borthwick