International Business Machines Corporation

James Bernard Webb

Edward Emile Kelley

Franco Motika

Donato Orazio Forlenza

Orazio Pasquale Forlenza

Todd Michael Burdine

William James Hurley

Steven Michnowski

An apparatus, program product and method utilize an ABIST circuit provided on an integrated circuit device to assist in the identification and location of defects in a scan chain that is also provided on the integrated circuit device. In particular, a defect in a scan chain may be detected by applying a plurality of pattern sets to a scan chain coupled to an ABIST circuit, collecting scan out data generated as a result of the application of the plurality of pattern sets to the scan chain, and using the collected scan out data to identify a defective latch in the scan chain.

ABIST-assisted detection of scan chain defects

A method is provided for a user to generate a password for a software application accessible from a computer system which includes a universal password generator (UPG). The UPG includes a specified parameter for generating the password, and the software application requires the password includes a specified parameter. The UPG is initiated and the universal password is inputted into the UPG. The specified parameter required by the application, and the UPG specified parameter are inputted into the UPG. The universal password is processed such that the specified parameter of the UPG, and the specified parameter of the application are used to generate the password. The password is then transferred to the application requiring the password. The password may be saved and associated in the UPG with the program such that when the user re-enters the program, the UPG program retrieves the password for reuse in the program.

Universal password generation method

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Wallkill, NY, United States of America

James Bernard Webb