Agilent Technologies, Inc.

James B Summers

Matthew Johnson

Richard P Ryan

Melvin D Humpherys

Kerwin D Kanago

David L Platt

In one embodiment, an algorithm is employed to calibrate electronic circuitry that is adjustable according to operating parameters. The calibration causes an output component to be substantially nulled. The algorithm includes adjusting at least one of the operating parameters over a plurality of values, applying an input signal to the electronic circuitry concurrently with the adjusting, measuring magnitudes of the output component from the electronic circuitry produced in response to the input signal and the adjusting, wherein the plurality of values are selected such that the magnitudes are not substantially nulled, and providing the magnitudes and the plurality of values to a curve fitting algorithm to calculate a plurality of operating parameters that cause the output component to be substantially nulled.

System and method for calibrating electronic circuitry

An RF test set having a concurrent measurement architecture is provided. The RF test set is adapted for testing an RF communications device such as a cellular phone according to a set of RF tests. An RF source and an RF receiver are used to communicate with the cellular phone in order to perform the call processing operations to control the cellular phone while performing parametric measurements according to the RF tests. Concurrent measurements allow operation of concurrent measurement processes and call processing operations to take place in the RF test set in order to decrease the time required for each RF test and to increase measurement throughput of the RF test set.

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Spokane Valley, WA, United States of America

James B Summers