High Yield Technology

Fisher Pierce Co.

James B Stolz

Peter G Borden

Mark A Nokes

Maurits Kain

Yung C Lee

George L Coad

Ron B Whitney

A dark-field particle monitor and a method for reducing errors due to stray light in the particle monitor provides a particle monitor having (i) an optical element focussed on the laser beam for detecting particles and (ii) a filter for preferentially selecting light incident on said filter in a preferential direction. In one embodiments the filter is implemented by a narrow band filter having maximum transmission for light having a wavelength of the laser beam.

Apparatus and method for reducing stray laser light in particle sensors

A method and an apparatus allow dynamic tuning of a particle sensor. The particle sensor provides output signals indicating particle detection to a controller, which includes an amplifier whose bandwidth and gain can be adjusted. The bandwidth and the gain of the amplifier are adjusted in accordance with predetermined optimal performance levels under the varying process conditions in which the particle sensor is placed. The optimal signal-to-noise ratio is maintained by adjusting the bandwidth and the gain according to both expected particle velocities and whether a plasma glow is present in the exhaust line for carrying gasses out of a process chamber.

Apparatus and a method for dynamically tuning a particle sensor in

A particle sensor which employs the principle that a particle passing through an intense laser beam will scatter light to a photodetector which then generates a measurable signal is provided. The particle sensor uses prisms and a cylindrical lens to compress the laser beam to make it very thin along the axis of particle motion but very wide in the plane perpendicular to particle motion, thereby simultaneously providing high beam intensity for enhanced sensitivity and a large detection area. The optical components of the sensor are mounted on separate sections which allows the optical components to be separately aligned and changed so that the sensor may be easily adapted to various applications.

High sensitivity, large detection area particle sensor for vacuum

A method and an apparatus for synchronizing particle counts to process events provide a trigger signal related to the process events in lieu of a time-based trigger signal. In one embodiment, the controller to a particle counter further subdivides a process event into sub-intervals to allow profiling of particle counts during the process event. In one embodiment, the controller of the particle counter receives multiple trigger signals corresponding to multiple trigger signal sources, each trigger signal source being identified by a source tag. Particle counts and time-stamps are maintained for each source of the trigger signals.

Method for synchronizing particle counters to external events

A raster scan apparatus provides a scanning assembly capable of moving in a sinusoidal motion along a first direction and stepping in fine steps in a second direction perpendicular to the first direction. In one embodiment, a piezoelectric bimorph sets in scanning motion a scanning assembly formed by a wafer holder and leaf springs. The amplitude of the scanning motion is controlled by a voltage applied across the piezoelectric bimorph. A Hall effect sensor provides an output signal indicating the instantaneous location of the scanning assembly in motion. The output signal of the Hall effect sensor is compared against a predetermined threshold to provide a trigger signal for synchronization. The output signal of the Hall effect sensor is also fed back to the source of sinusoidal voltage to adaptively adjust the sinusoidal voltage so as to achieve a predetermined amplitude for the scanning motion.

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Milpitas, CA, United States of America

James B Stolz