Advanced Micro Devices Corporation

James A Wingfield

Russell J Schreiber

Keith Allen Kasprak

Michael Estlick

Grady L Giles

Atchyuth Gorti

Michael L Golden

Eric W Busta

Arijit Banerjee

Srinivas R Sathu

William A Halliday

Vance Threatt

Sean M O′Mullan

A disclosed technique includes based on a clock pattern, determining an enable configuration for setting enable signals for one or more multi-cycle paths of a hardware logic network, setting the enable configuration for the one or more multi-cycle paths, and executing testing operations for the hardware logic network with the one or more multi-cycle paths enabled according to the enable configuration.

Testing multi-cycle paths using scan test

An integrated circuit includes one or more processing units that execute instructions that employ a register file, control logic creates a pre-startup register free list, prior to normal operation of at least one of the processing units, that includes a list of registers devoid of defective registers. In some implementations, no column and row repair information is provided to register file repair logic. In certain examples, the register file is configured as a repair-less register file. During normal operation of the one or more processing units, the integrated circuit employs the pre-startup register free list to select registers in a register file for the executing instructions. Associated methods are also presented.

Methods and apparatus for managing register free lists

An integrated circuit includes a memory core and a built-in self-test (BIST) controller. The memory core has an array of memory cells located at intersections of a plurality of word lines and a plurality of bit line pairs. The BIST controller is coupled to the memory core and has a mission mode and a built-in self-test mode. When in the mission mode, the BIST controller performs read and write accesses using precharge on demand. When in the built-in self-test mode, the BIST controller performs a floating bit line test by draining a voltage on true and complement bit lines of a selected bit line pair and subsequently precharging the true and complement bit lines of the selected bit line pair, before reading or writing data using the true and complement bit lines of the selected bit line pair.

Integrated circuit memory with built-in self-test (BIST)

A test circuit for a functional circuit includes a scan chain coupled to the functional circuit, and a controller coupled to the scan chain, for controlling the scan chain to scan a test pattern into the scan chain, and subsequently and repetitively for a multiple number of times launch the test pattern to the functional circuit, capture test data into the scan chain, and restore the test pattern in the scan chain for subsequent launch.

Test circuit having scan warm-up

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Austin, TX, United States of America

James A Wingfield