Quicklogic Corporation

James A Apland

Paige A Kolze

Andrew K Chan

A programmable integrated circuit (see FIG. 13) includes a plurality of routing resources including collinearly extending routing wire segments and a test circuit for testing the integrity of the routing wire segments. The routing resource structures include a plurality of unprogrammed antifuses disposed between routing wire segments and a plurality of transistors disposed electrically in parallel with a corresponding respective one of the antifuses. The test circuit has a common node that may be coupled to a selected one of the routing resource structures for testing. In test mode, the test circuit detects whether a current flows through the selected routing resource structure and in response provides either a digital low value or a digital high value on an output node.

Programmable integrated circuit having a test circuit for testing the

A field programmable gate array has columns of logic modules. A programming conductor used to conduct programming current to program antifuses of the field programmable gate array extends between two adjacent columns of logic modules. First wire segments extend from the programming conductor and toward the logic modules of a first of the two adjacent columns. Second wire segments extend the opposite direction from the programming conductor and toward logic modules of the second of the two adjacent columns. Programming current used to program antifuses disposed along the first wire segments as well as antifuses disposed along the second wire segments can be supplied from the same programming conductor that extends between the two columns of logic modules. The logic modules of the first column are mirrored versions of the logic modules of the second column.

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Gilroy, CA, United States of America

James A Apland