Divergent Technologies, Inc.

Jakub Preis

Lukas Philip Czinger

Eric Paul Monteith

Aron Derecichei

Richard Kingston

Keith Mckay

Sam Miller

Aspects for implementing 3-D printed metrology feature geometries and detection are disclosed. The apparatus may a measurement device for a 3-D printed component. The component may include a plurality of printed-in metrology features arranged at different feature locations on a surface of the component. The measurement device can be configured to detect the feature locations of the printed-in metrology features and to determine a position or an orientation of the component based on the detected feature locations. In various embodiments, the metrology feature may be a protruding or recessed spherical portion, with the corresponding feature location at the center of the sphere.

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Los Angeles, CA, United States of America

Jakub Preis