Trinamix Gmbh

Jakob Unger

Patrick Schindler

Christian Lennartz

Peter Schillen

Friedrich Schick

Robert Send

Ingmar Bruder

Michael Eberspach

Lars Diesselberg

Christian Bonsignore

Heiko Hengen

Andre Schmidt

Ruben Huehnerbein

Disclosed herein is a detector for determining at least one material property of at least one object. The detector includes

Enhanced material detection by stereo beam profile analysis

Described herein are systems including a structured light projector, a semiconductor detector, and a processor. Also described herein is a non-transitory computer readable medium storing executable instructions. The systems and non-transitory computer readable medium are configured to output a signal including information related to the classification of an object.

Detector for identifying at least one material property

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature φ2m.

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature ϕ2m.

A detector for determining a position of at least one object, the detector including:

Auto calibration from epipolar line distance in projection pattern

Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property by evaluation of at least one beam profile of the reflection image.

A detector () for determining at least one material property of at least one object () is proposed. The detector () comprises

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Freiburg im Breisgau, Germany

Jakob Unger