Lg Electronics Inc.

Psia Corporation

Jaewan Hong

Sang-Il Park

Dongjin Lee

Jongpil Kim

Hakhae Kim

Sungbum Joo

Byeongkil Kang

Joonhyung Kwon

Zheong-Gu Khim

Disclosed is a mobile terminal devised to achieve a reduced F-number and an increased T-number by enhancing the brightness of an optical system provided therein. In the mobile terminal including an optical module that configures a single optical system, the optical module includes a lens group configured with five or more refractive lenses including at least one glass lens. The glass lens has a thickness equal to or greater than 0.3 mm, an effective diameter equal to or greater than 1.5 mm and equal to or less than 8.0 mm, a refractive index below 1.6, and an Abbe's number equal to or greater than 60.

Mobile terminal

An electronic device includes a display unit, a bezel portion, and a camera module disposed beneath the bezel portion and provided with a pair of flat surfaces facing each other, wherein the camera module includes a plurality of rim guides each including first and second flat surfaces facing each other, and first and second curved surfaces connecting the first and second flat surfaces, the plurality of rim guides being laminated with forming spaces apart from one another, a plurality of lens portions formed within the plurality of rim guides, respectively, and forming a specific focal length, and an image sensor overlapping the plurality of lens portions and generating an image using light that has passed through the plurality of lens portions.

Electronic device having camera device and method for fabricating camera device

A scanning probe microscope uses two different scanners (also called &ldquo;scanning stages&rdquo;) that are completely detached each from the other, and are physically separated by a stationary frame. One scanner (called &ldquo;x-y scanner&rdquo;) scans a sample in a plane (also called &ldquo;x-y plane&rdquo;), while the other scanner (called &ldquo;z scanner&rdquo;) scans a probe tip (which is supported at a free end of a cantilever) in a direction (also called &ldquo;z direction&rdquo;) perpendicular to the plane. Detachment of the two scanners from one another eliminates crosstalk.

Scanning probe microscope with improved scan accuracy, scan speed, and optical vision

A microscope uses electrostatic force modulation microscopy to measure mechanical and electrical characteristics of a sample. A tip contacts the sample while a voltage (which may have dc and ac components) is applied between the tip and sample. The tip oscillates even though the tip is contacting the sample due to strong electrostatic force interaction between the tip and sample. Different characteristics of the sample such as hardness, surface potential, capacitance, surface charge, and so forth, are measured by manipulating the oscillation of the tip relative to the sample and monitoring the position of the tip.

Method and apparatus for measuring mechanical and electrical characteristics of a surface using electrostatic force modulation microscopy which operates in contact mode

Growing community of inventors

Seoul, South Korea

Jaewan Hong