Samsung Electronics Co., Ltd.

Pukyong National University

Jaemoon Lim

Joseph Kim

Younghoon Jeong

Chul Ju Lee

Youngsu Moon

Chun Zhao

Hoang Nam Nguyen

Van Tu Vo

Junghoo Yun

A method of testing a semiconductor device includes forming conductive bumps respectively on a plurality of bonding pads of the semiconductor device. The semiconductor device having the conductive bumps is supported on a substrate stage. A gripper having first and second holders spaced apart from each other is positioned over the conductive bump. The conductive bump is clamped between the first and second holders. The gripper clamping the conductive bump is reciprocated at a constant speed with a predetermined stroke in a horizontal direction parallel with an upper surface of the substrate stage. A reliability of the semiconductor device is determined by measuring a time point at which a crack occurs in an upper wiring connected to the bonding pad.

Test apparatus and method for a semiconductor device

Disclosed is an electronic device. The electronic device obtains a first histogram regarding a difference in gradation between adjacent pixels of an input image based on the first maximum output brightness, obtains a second histogram regarding a difference in gradation between the adjacent pixels of the input image based on the second maximum output brightness, obtains a third histogram regarding a difference in brightness between the adjacent pixels of the input image based on the first HVS recognition information, obtains a fourth histogram regarding a difference in brightness between the adjacent pixels of the input image based on the second HVS recognition information, and obtains a brightness value regarding the input image corresponding to the second maximum output brightness based on a difference between a first value obtained based on information on the first and third histograms and a second value obtained based on the second and fourth histograms.

Electronic device and control method thereof

A display device is disclosed. The display device comprises: a storage configured to store output brightness information for each gradation according to brightness information of an image; and a processor configured to acquire target brightness corresponding to brightness information of an input image on the basis of the information stored in the storage, acquire a target light amount on the basis of a light amount of the input image, acquire a plurality of correction effects corresponding to a plurality of correction images by applying a plurality of gradation adjustment curves to the input image, acquire a gradation adjustment curve corresponding to the maximum correction effect among the plurality of correction effects, and adjust and output a gradation for each pixel of the input image on the basis of the acquired gradation adjustment curve.

Display device and method for controlling brightness thereof

Growing community of inventors

Suwon-si, South Korea

Jaemoon Lim