Samsung Electronics Co., Ltd.

Korea Advanced Institute of Science and Technology

Jaehyung Ahn

Wooseok Chang

Seongbeom Kim

Uiseok Song

Junyeon Lee

Jieun Lee

Janghee Lee

Yusin Yang

Younghoon Sohn

Chungsam Jun

Souk Kim

Jin-hong Kim

Sung Yoon Ryu

Yongha Park

Wahseng Yap

Sungduk Cho

Kwangeun Kim

Minsoo Rhu

Yunjung Jee

Joonseo Song

Byungwoo Bang

Hun Seong Choi

Yujeong Choi

Yoo Jin Jeoung

A processor-implemented data processing method includes: receiving a request for executing a neural network model on an accelerator; generating a plurality of candidate kernels for each of a plurality of layers comprised in the model; and allocating, to the accelerator, a single candidate kernel that is selected from among a plurality of candidate kernels for a layer to run on the accelerator based on corresponding kernel information and status information of the accelerator.

Data processing method and apparatus for excuting neural network on accelerator

A scanning electron microscope (SEM) includes an electron gun, a deflector, an objective lens, first and second detectors each configured to detect emission electrons emitted from the wafer based on the input electron beam being irradiated on the wafer, a first energy filter configured to block electrons having energy less than a first energy among emission electrons emitted from a wafer based on an input electron beam from being detected by the first detector, and a second energy filter configured to block electrons having energy less than second energy among the emission electrons from being detected by the second detector.

Method of operating scanning electron microscope (SEM) and method of manufacturing semiconductor device using the same

A method of operating an accelerator includes receiving, from a central processing unit (CPU), commands for the accelerator and a peripheral device of the accelerator, processing the received commands according to a subject of performance of each of the commands, and transmitting a completion message indicating that performance of the commands is completed to the CPU after the performance of the commands is completed.

Accelerator, method of operating the accelerator, and device including the accelerator

A method and apparatus with cosmic ray fault protection is included. A method includes obtaining cosmic ray information indicating at least one cosmic ray event, determining a soft error mitigation policy based on the cosmic ray information, accessing the soft error mitigation policy by a device, and based on the soft error mitigation policy, performing, by the device, a mitigation action that mitigates for soft errors related to the cosmic ray event.

Method and apparatus with cosmic ray fault protection

An electronic device and method with on-demand accelerator checkpointing are provided. In one general aspect, an electronic device includes a host processor, and an accelerator configured to operate according to instructions transmitted by the host processor to the accelerator, wherein, a memory of the host processor and a memory of the accelerator are respectively checkpointed to a storage at respective different intervals, and in response to a determination that a failure has occurred in the host processor, the memory of the accelerator is checkpointed to the storage.

Electronic device and method with on-demand accelerator checkpointing

An active scheduling method performed with a master processor and a plurality of slave processors. The method includes determining whether a job to be performed has a dependency by referencing a job queue; in a case in which it is determined that the job to be performed has a dependency, updating a state of the job to be performed in a table in which information of each of a plurality of jobs is recorded; analyzing a state of a job preceding the job to be performed based on the table; and in a case in which the job preceding the job to be performed is determined to have been completed, performing the job to be performed by retrieving the job to be performed from the job queue.

Active scheduling method and computing apparatus

A method of operating the accelerator includes receiving a request for preemption during an execution of a first task using one or more processing elements included in the accelerator, in response to the request for preemption, moving context information of the first task stored in an internal memory of the accelerator to an external memory of the accelerator, and executing a second task associated with the request for preemption using the processing elements.

Method and apparatus with accelerator

A method of inspecting a semiconductor wafer is provided, the method includes scanning a plurality of inspection swaths on a wafer to obtain a plurality of image sets and producing a plurality of reference images from the plurality of image sets, respectively. The method of inspecting a semiconductor wafer further includes selecting a plurality of target images from the plurality of image sets, respectively. The method of inspecting a semiconductor wafer additionally includes comparing each reference image of the plurality of reference images with each target image of the plurality of target images to detect a defect image from each of the plurality of target images. A reference image being compared and a target image being compared are images scanned from the same inspection swath.

Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the same

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Suwon-si, South Korea

Jaehyung Ahn