Lg Electronics Inc.

Jaehong Eom

Hyunwoo Kim

Sangyun Kim

Run Cui

Yi Hu

A product inspection apparatus including a camera configured to capture an image of a product to be inspected; and a processor configured to extract defect information from a defect indicated by the captured image of the product, generate first virtual defect data including at least one of a location, a size and a shape of the defect included in the captured image, based on the extracted defect information, generate second virtual defect data by synthesizing the first virtual defect data with non-defect data representing the product without the defect, and generate final virtual defect data by inputting the second virtual defect data to an artificial intelligence generative model.

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Seoul, South Korea

Jaehong Eom