Samsung Electronics Co., Ltd.

Jaegyu Choi

Kwangkyu Bang

Yun Chang

Kiljoong Yun

Tae-Yong Kim

Jiwon Park

Songrye Choi

Dongjin Lim

Wonchol Kim

Sanggeun Yoo

Eok Soo Shim

A storage device including: a nonvolatile memory; and a controller configured to control the nonvolatile memory, wherein the controller is configured to: obtain authority to access an external memory, wherein the external memory is allocated by an external host device; receive a test scenario, which includes a plurality of commands, from the external host device; read a first test code corresponding to a first test check point from the external memory when the first test check point arrives while the test scenario is executed; and execute the first test code.

Storage device and method of testing storage device

Embodiments provide a power loss protection (PLP) module that is connected to a first storage device to perform a PLP operation for the first storage device, including: a volatile memory that stores data according to commands of a host; a non-volatile memory that receives and stores data of the volatile memory when the first storage device becomes inaccessible; a capacitor module that supplies a voltage to the volatile memory and the non-volatile memory when the first storage device becomes inaccessible; and a controller that controls operations of the volatile memory, the non-volatile memory, and the capacitor module.

Power loss protection (PLP) operation and PLP module for electronic devices

A module substrate for a semiconductor module includes: a wiring substrate having an upper surface and a lower surface opposite to the upper surface, wherein the wiring substrate includes a circuit wiring and a plurality of via holes extending from the upper surface to the lower surface in a thickness direction; a plurality of test terminals respectively provided on the via holes and electrically connected to the circuit wiring, and a fastening thin film provided on the wiring substrate and covering the via holes, wherein the fastening thin film has a predetermined thickness such that a portion of the fastening thin film is penetrated when an interface is pin is inserted into the portion of the fastening thin film through the via hole from the upper surface, and the portion of the penetrated fastening thin film holds the penetrating interface inspection pin.

Module substrate for semiconductor module, semiconductor module and test socket for testing the same

A test socket includes: a first body including a fixing portion configured to receive a sample having a plurality of test terminals; a second body facing the first body and coupled with the first body such that the second body rotates relative to the first body about a hinge pin; a test board provided on the second body and configured to test the sample, wherein the test board has a plurality of first openings provided therein; and a plurality of interface pins penetrating through the first openings, wherein each of the plurality of interface pins includes a contact pin and a spring, wherein the contact pin is provided in a first end portion of each of the plurality of interface pin and is configured to come into contact with a test terminal of the plurality of test terminals, and the spring elastically supports the contact pin.

Test socket for performing a test on an electronic device

A storage device testing module includes a plate and a test board disposed on the plate and including a storage device receiver, the storage device receiver receiving a storage device to be tested. The storage device testing module further includes a sensor including a plurality of switches disposed on an inner surface of the storage device receiver, the plurality of switches being activated by movement of the storage device into the storage device receiver. The storage device testing module further includes a plurality of plungers disposed on the inner surface, contacting and supporting the storage device.

Growing community of inventors

Seongnam-si, South Korea

Jaegyu Choi