Growing community of inventors

Hwaseong-si, South Korea

Jae Mock Yi

Average Co-Inventor Count = 5.00

ph-index = 3

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 15

Jae Mock YiYoung Hun Sung (5 patents)Jae Mock YiJae Hak Lee (5 patents)Jae Mock YiDong Goo Kang (4 patents)Jae Mock YiSeok Min Han (4 patents)Jae Mock YiJi Young Choi (2 patents)Jae Mock YiByung Kwan Park (2 patents)Jae Mock YiJae Sung Lee (1 patent)Jae Mock YiDong-Goo Kang (1 patent)Jae Mock YiHong Ju Jung (1 patent)Jae Mock YiYoung Beom Kim (1 patent)Jae Mock YiKye Young Jeong (1 patent)Jae Mock YiSeong Deok Lee (1 patent)Jae Mock YiJung Ah Son (1 patent)Jae Mock YiJae Mock Yi (7 patents)Young Hun SungYoung Hun Sung (133 patents)Jae Hak LeeJae Hak Lee (40 patents)Dong Goo KangDong Goo Kang (35 patents)Seok Min HanSeok Min Han (28 patents)Ji Young ChoiJi Young Choi (9 patents)Byung Kwan ParkByung Kwan Park (2 patents)Jae Sung LeeJae Sung Lee (56 patents)Dong-Goo KangDong-Goo Kang (31 patents)Hong Ju JungHong Ju Jung (13 patents)Young Beom KimYoung Beom Kim (8 patents)Kye Young JeongKye Young Jeong (7 patents)Seong Deok LeeSeong Deok Lee (2 patents)Jung Ah SonJung Ah Son (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Samsung Electronics Co., Ltd. (7 from 131,214 patents)

2. Snur & Db Foundation (1 from 547 patents)


7 patents:

1. 9928618 - X-ray imaging apparatus and method of controlling the same

2. 9907528 - X-ray imaging apparatus, image processing apparatus and image processing method

3. 9743901 - X-ray imaging apparatus and method of controlling the same

4. 9658348 - X-ray detector, X-ray imaging apparatus having the same, and method of controlling the same

5. 9649081 - X-ray image apparatus and control method for the same

6. 9472001 - Image processor, image reconstruction method, and radiation imaging apparatus

7. 9207301 - Apparatus and method for compensating artifact in higher order diffusion magnetic resonance imaging (MRI)

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as of
12/4/2025
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