Goldstar Electron Co., Ltd.

Jae-Jeong Kim

Chang-Jae Lee

The present invention provides a process for forming an MOS semiconductor device having an LDD structure, which includes a forming a gate electrode by first etching a conductive layer to a certain depth by an RIE process and by second etching the conductive layer by an isotropic plasma etching process. In forming the source/drain of the device, an n.sup.+ source/drain and an n.sup.- source/drain are formed in a sequential manner. The gate line first is formed with its width over-sized compared with its channel length, and finally is formed to its final size.

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Cheongju-si, South Korea

Jae-Jeong Kim