Electronics and Telecommunications Research Institute

Jae Hoo Lee

Bon Ki Koo

Ji Young Park

Seung Woo Nam

Dong Won Han

Kwang Hyun Shim

Myung Ha Kim

Provided is an apparatus and method for obtaining depth information using an optical pattern. The apparatus for obtaining depth information using the optical pattern may include: a pattern projector to generate the optical pattern using a light source and an optical pattern projection element (OPPE), and to project the optical pattern towards an object area, the OPPE comprising a pattern that includes a plurality of pattern descriptors; an image obtaining unit to obtain an input image by photographing the object area; and a depth information obtaining unit to measure a change in a position of at least one of the plurality of pattern descriptors in the input image, and to obtain depth information of the input image based on the change in the position.

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Daejeon-si, South Korea

Jae Hoo Lee