Electro Scientific Industries, Inc.

Jae H Kim

Joseph Emery

Michael Charley Stocks

James Ray Huntington

Paul Plachinda

Daniel Joel Boatright

A non-contact handler includes an upper body portion and a lower body portion movably coupled to the upper body portion. The lower body portion includes a non-contact puck configured to lift an object and a plurality of containment fences extending downward from the puck. The plurality of containment fences are arranged around a periphery of the object to be lifted.

Non-contact handler and method of handling workpieces using the same

Detecting misalignment of test probes with component carriers in an automated test system is taught. Automated test systems for testing electronic components can have electronic components held in component carriers in preparation for testing. Testing can include moving test probes through openings provided in the component carrier to contact the electronic components held therein. Aspects of disclosed implementations use force feedback from the test probes to determine if the test probes have successfully contacted the electronic component without, for example, contacting the component carrier.

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Lake Oswego, OR, United States of America

Jae H Kim