Techwing Co., Ltd.

Samsung Electronics Co., Ltd.

Jae-Gyun Shim

Yun-Sung Na

In-Gu Jeon

Tae-Hung Ku

Dong-Han Kim

Su-Myung Lee

Hyun-Jun Yoo

Seung-Won Jeon

Jae-Sung Park

Dong Hyun Yo

Jung-Woo Hwang

Nam-hyoung Kim

Beum-hee Lee

A test handler is provided, which comprises a test tray, at least one opening unit, and a position changing apparatus. The test tray aligns a plurality of inserts on its side. Each insert loads at least one semiconductor device thereon. The opening unit opens inserts at one part of the one side of the test tray. The position changing apparatus moves at least one opening unit in such a way that the at least one opening units can be located at another part of the one side of the test tray, such that the at least one opening units can open inserts at said another part of the one side of the test tray. The present invention can reduce the number of replaced parts according to change in the semiconductor device size, production cost, and part replacement time.

Test handler and method for operating the same for testing semiconductor devices

A test tray for a test handler is disclosed that is loaded with semiconductor devices and then carries them along a predetermined circulation route. The test tray allows one fixing unit to fix a plurality of adjacent insert modules to the receiving spaces of the frame, thereby efficiently using the space of the frame and allowing a relatively large number of insert modules to be installed in the same area, in comparison to the conventional test tray.

Test tray for test handler

A test handler and method for operating a test handler for testing semiconductor devices are provided. The test handler includes a test tray located on one side of an opening apparatus in which a plurality of inserts are arrayed, wherein each insert comprises at least one semiconductor device loaded thereon, at least one opening unit for opening inserts at one part of the one side of the test tray, and a position changing apparatus comprises a motor including a driving pulley for moving at least one opening unit along a contact surface of the test tray such that the at least one opening unit changes positions on the test tray and is located at another part of the one side of the test tray in order to open inserts at the other part of the one side of the test tray.

A pick-and-place apparatus for transferring and loading semiconductor devices between first and second loading elements is provided. The pick-and-place apparatus includes a multiplicity of picking unit modules, each of which has at least one or more picking units, and an interval regulation apparatus for regulating intervals between the picking unit modules at the first to third modes. The first to third row interval values are different from each other. The intervals between the picking unit modules are all regulated to be identical to the first row interval at the first mode, are alternately regulated to the second row interval and the third row interval in turn at the second mode, and are alternately regulated to the third row interval and the second row interval in turn at the third mode.

Pick-and-place apparatus

A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in a horizontal direction. The first to third horizontal movement units are independently operated such that each of the first to third transfers can perform independently horizontal movements. Each of the first to third transfers performs based on its previously allocated function, thereby enhancing test process speed for devices.

Test Handler

A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed on one part of the test tray, and a test tray transfer apparatus for allowing the opening unit to simultaneously open other parts of the plurality of inserts which are arrayed on another part of the test tray as the test tray is transferred. Therefore, although semiconductor devices to be tested change their sizes, the replaced parts of the test handler are reduced in number, thereby reducing manufacturing cost and replacement work time. The inventive test handler reduces semiconductor devices loading time, reduces jamming, increases teaching efficiency and improves space utilization efficiency. Furthermore, the test handler can be applied to various types of testers.

Test handler

When a test handler loads semiconductor devices of user trays onto a test tray, the test handler adjusts a front/rear pitch or a right/left pitch between the semiconductor devices, adjusts the right/left pitch or the front/rear pitch, and loads the semiconductor devices. The test handler can sequentially adjust individually the front/rear pitch and the right/left pitch between the semiconductor devices, thereby reducing the apparatus weight and the loading time.

Test handler and loading method thereof

A test handler is disclosed. The test handler includes first to third transfers for transferring a user tray, and first to third horizontal movement units suitable for respectively moving the first to third transfers in the horizontal direction. The first to third horizontal movement units are independently operated such that each of the first to third transfers can perform independently horizontal movements. Each of the first to third transfers performs based on its previously allocated function, thereby enhancing test process speed for devices.

A test handler is disclosed. A posture changing unit for changing a posture of a test tray on which semiconductor devices have been loaded changes the posture of the test tray in a soak chamber. While the posture of the test tray is changed, the devices can be pre-heated/pre-cooled, thereby reducing the soak chamber length and the pre-heating/pre-cooling time.

Position changing apparatus for test handler and power transferring apparatus

Test handler comprising at least one opening unit opening one part of the plurality of inserts

Test handler and operation method thereof

The present invention discloses a test handler comprising a main body, a stocker including a user tray supplier and a user tray deliverer for loading plurality of user trays carrying the semiconductor device during devices tests, a plurality of test trays, a device loading means for transferring the devices in the user tray of the user tray supplier to the test tray, a first tray inverter changing the horizontal posture of the test tray, a soak chamber preparing a desired test temperature condition, a test chamber accomplishing tests, a de-soak chamber restoring the devices temperature, a second tray inverter inverting to the test tray of a horizontal posture, a device unloading means transferring the semiconductor devices on the test tray. The present invention can double the lot size in unit operation to improve equipment operation ratio. In more, the device loading time and unloading can be reduced so that the number of the devices treated in unit operation can be increased.

A test tray insert of a test handler is provided including a housing, a locker, and a stopper, where one end side of the stopper is hinged on the inside of the mounting hole and the other end side of the stopper is protruded to the receiving hole so that the stopper fixes the device. The housing includes a receiving hole for loading a device in the enter of the receiving hole, and a mounting hole, extended from both sides of the receiving hole, including a joint jaw. The housing further includes a base protrusion placed n both ends of the bottom of the receiving hole and a supporting protrusion placed in both sides of the base protrusion.

Test tray insert of test handler

A test handler for automatically testing rambus type semiconductor devices. The rambus type test handler includes a user tray stacker for stacking a plurality of user trays which are loaded with semiconductor device that have been, or will be tested; a device loading portion for picking up the semiconductor devices from the user trays at a supplying position and loading the semiconductor devices onto boats at a loading position; a heating/cooling chamber for heating or cooling the boats according to test requirements by order of boat receipt from device loading portion; a test chamber for connecting the heated or cooled semiconductor devices to test sockets for testing; a recovering chamber for recovering the temperature of the semiconductor devices to a normal degree, while elevating the boats and discharging the boats through an upper end, sequentially, by order of boat receipt from a lower end of the test chamber; a device sorting portion for picking up test-completed semiconductor devices from the boats discharged from the recovering chamber and stacking respective grades of semiconductor devices to correspondingly predetermined areas of a plurality of conveying buffers; and a device unloading portion for stacking the semiconductor devices from the conveying buffers to the user trays corresponding to the respective grades of the semiconductor devices. Further, there are provided a device loading portion, displaceable hand for sorting the semiconductor devices, contact picker assembly of the test chamber, and position guiding portion.

Growing community of inventors

Suwon, South Korea

Jae-Gyun Shim