Korea Advanced Institute of Science and Technology

Samsung Electronics Co., Ltd.

Jae Duck Jang

Jong Chul Ye

Young Hun Sung

Min Woo Kim

Dong Goo Kang

Ji Young Choi

A nano-scale resolution fluorescence microscopy system and a method of obtaining an image using the nano-scale resolution microscopy system, and more particularly, a method and a microscopy system, capable of observing fluorescence probes in high resolution by radiating an irregular diffused light to have an incoherent speckle pattern that has low correlation in an adjacent space are disclosed. According to embodiments of the present invention, a diffraction limit of a fluorescence microscope may be overcome, and a super high resolution image on a nanometer scale may be obtained.

Super-resolution microscopy system using speckle illumination and array signal processing

An apparatus and method of reconstructing a three-dimensional (3D) image from two-dimensional (2D) images are disclosed. Three dimensional (3D) data may be reconstructed in an x-ray generation tube at a limited angle, and repeatedly updated for each pixel. A median from among each pixel of reconstruction data may be selected. Backprojecting may be performed using a search direction weight calculated using a reprojection image and residual image. A 3D image satisfying a Level 1 (L1) norm fidelity and sparsity constraint of the reconstruction data may be reconstructed.

Method and apparatus of reconstructing 3D image from 2D images

Growing community of inventors

Daegu-si, South Korea

Jae Duck Jang