Stmicroelectronics S.r.l.

Sgs-thomson Microelectronics S.r.l.

Hynix Semiconductor Inc.

Stmicroelectronics Asia Pacific Pte Limited

Jacopo Mulatti

Andrea Ghilardelli

Maurizio Branchetti

Marco MacCarrone

Stefano Zanardi

Marcello Carrera

Giovanni Campardo

Carla Maria Golla

Rino Micheloni

Ignazio Martines

Massimiliano Picca

Stefano Ghezzi

Stefano Commodaro

Matteo Zammattio

Donghyun Seo

Roberto Annunziata

Paolo Colombo

Guido Lomazzi

Kuhong Jeong

St Fano Surico

Armando Conci

Taegyoung Kang

Hyungsang Lee

Giovanni Nuzzarello

A power on reset circuit initializes at power on a digital integrated circuit, and includes a first power on reset signal generator powered by an external power supply voltage and generates a first power on reset signal. A reference voltage generator is powered by the external power supply voltage, and is enabled by the first power on reset signal for generating a stable compensating reference voltage. A voltage down converter circuit receives the reference voltage and is enabled by the first power on reset signal, and converts the external applied power supply voltage to a stable regulated internal supply voltage. A second power on reset signal generator circuit receives the regulated internal supply voltage, and is enabled by the first power on reset signal for generating a second power on reset signal for core parts of the digital integrated circuit for initializing them at power on.

Power on reset circuit for a digital device including an on-chip voltage down converter

A method of programming cells in a nonvolatile memory is based upon a Global Verify operation and a Byte-by-byte Verify operation. The cells of a destination page of the nonvolatile memory are programmed, and logic values stored in the programmed cells of a source page of the same memory are verified that they have been correctly copied into corresponding cells of the destination page. The method carries out the fast but inadequate-at-times Global Verify operation, and if the Global Verify operation fails for a certain number of attempts, the Byte-by-byte Verify operation is carried out, which is slower but accurate.

Method of programming and verifying cells of a nonvolatile memory and relative NAND FLASH memory

A basic stage for a charge pump circuit having at least an input terminal and an output terminal and comprising: at least a first inverter inserted between said input and output terminals and comprising a first complementary pair of transistors, defining a first internal node, at least a second inverter inserted between said input and output terminals and comprising a second complementary pair of transistors, defining a second internal node, respective first and second capacitors connected to said first and second internal nodes and receiving first and second driving signals; the first and second pairs of transistors having the control terminals cross-connected to the second and first internal nodes. Advantageously, the basic stage comprises at least a first biasing structure connected to the first and second internal nodes and comprising first and second biasing transistors, which are respectively coupled to said first and second inverters.

Basic stage for a charge pump circuit

The programming method includes the following steps: sequentially receiving a plurality of data words; temporarily storing each data word after its reception; and simultaneously writing in parallel the plurality of stored data words in a memory array. After reception and temporary storage of each data word, the memory increments an address counter and sends a 'ready' signal. Upon reception of each new data word, the memory verifies whether the address associated thereto is in the same sector as the initial data word and whether n data words have already been stored. If the sector is different, blind-programming step is terminated and the verifying is carried out; if the sector is the same but n data words have already been stored temporarily, the memory writes the temporarily stored words in the memory array, updates the address counter, and then sends the 'ready' signal.

Fast programming method for nonvolatile memories, in particular flash memories, and relative memory architecture

An integrated device having a pad receiving, in a standard operative condition, an input signal having a first value and, in a test operative condition, a test voltage having a second value higher than the first value; an input stage connected to the pad and including an electronic component having a first terminal connected to the pad; a third-level detecting stage connected to the pad and supplying a logic third-level signal having a first level in presence of the input signal and a second level in presence of the test voltage; and a selector connected to a second terminal of the electronic component and structured to connect the second terminal to a reference potential in the presence of the first logic level of the third-level signal and to a biasing voltage higher than the reference potential and lower than the second value in the presence of the second logic level of the third-level signal.

Integrated device with operativity testing

Presented is an analog voltage value measuring device for measuring any of a set of voltage references that are generated inside a memory architecture. The selected voltage to be measured is connected to a facility line through a multiplexer. The memory architecture includes a set of output buffers connected to a respective set of output pads. The device also includes a converter block, connected between the facility line and the output buffers of the memory architecture for converting a measured analog value of a voltage reference selected by the multiplexer to a digital value, which is presented on the output pads. A method of measuring an analog voltage value in a memory device is also disclosed. The method includes selecting an analog voltage value from the set of voltage values; transferring the selected analog value onto the facility line; converting the selected analog value to a digital value; and presenting the digital value on the output pads.

Method and a device for measuring an analog voltage in a non-volatile memory

Presented is a memory architecture including at least first, second and third voltage booster circuits adapted to generate, on respective first, second and third circuit nodes, at least first, second and third boosted voltage references. These boosted references are in turn connected to first, second and third adjusters, which are adapted to provide respective first, second and third voltage references as required for the operations of programming, erasing and verifying cells of the memory architecture. At least a first switch block is used that connects between the first and third circuit nodes and is controlled by a first control signal to place the first and third high-voltage references in parallel during cell verify operations, thereby to provide one equivalent high-voltage source having a higher capacity for current than individual sources and effectively speed up the charging of the first circuit node so as to shorten the settling time of the first voltage reference. A method is also presented for generating voltage references with a reduced value of settling time as produced within a memory architecture.

Method and apparatus for generating from a single supply line voltages internal to a flash memory with reduced settling times

A low-consumption TTL-CMOS input buffer stage includes a chain of inverters cascade connected between an input receiving electric signals at a TTL logic level and an output reproducing electric signals at a CMOS logic level, and powered between a first or supply voltage reference and a second or ground reference. Advantageously, the first inverter in the chain includes a means of selecting the delivery path to the stage according to an activate signal for a low-consumption operation mode. In essence, the first inverter of the buffer has two signal paths: one for normal operation and the other for low consumption operation.

Low-consumption TTL-CMOS input buffer stage

A voltage regulator for memory circuits has a differential stage having a non-inverting input terminal receiving a control voltage independent of the temperature; an inverting input terminal connected to a ground voltage reference; a feed terminal connected to a booster circuit adapted for producing a boosted voltage; and an output terminal connected to an output terminal of the voltage regulator, for producing an output voltage reference starting from the comparison of input voltages. The voltage regulator further comprises a connecting transistor inserted between the feed terminal and the output terminal of the differential stage, the connecting transistor being source follower having a control terminal connected to the output terminal of the differential stage, as well as a source terminal connected to the output terminal of the voltage regulator, in such a way as to self-limit the transition of the voltage on the output terminal.

Voltage regulator for single feed voltage memory circuits, and flash type memory in particular

An ESD protection network protects a CMOS circuit structure integrated in a semiconductor substrate. The circuit structure includes discrete circuit blocks formed in respective substrate portions which are electrically isolated from one another and independently powered from at least one primary voltage supply having a respective primary ground, and from at least one secondary voltage supply having a respective secondary ground. This network includes a first ESD protection element for an input stage of the circuit structure; a second ESD protection element for an output stage of the circuit structure, the first and second protection elements having an input/output pad of the integrated circuit structure in common; a first ESD protection element between the primary supply and the primary ground; and a second ESD protection element between the secondary supply and the secondary ground.

ESD protection network for circuit structures formed in a semiconductor

Circuit for discharging to ground, supplied by a supply voltage, comprising a reference voltage, a negative potential node, first circuitry adapted to couple the negative potential node to the reference voltage in response to a control signal. Second circuitry is provided adapted to determine in the first circuitry the passage of a controlled current for the discharge of the negative potential node.

Circuit for discharging a negative potential node to ground, including control of the discharge current

A charge pump comprises at least one charge pump stage including a first diode having an anode and a cathode, and a capacitor having a first plate connected to the cathode of the diode and a second plate connected to a clock signal that periodically varies between a reference voltage and a supply voltage, the anode of said diode forming a first terminal of the charge pump. The charge pump further comprises a second diode having an anode connected to the cathode of the first diode and a cathode forming a second terminal of the charge pump, first switching means for selectively coupling the first terminal of the charge pump to the voltage supply and second switching means for selectively coupling the second terminal of the charge pump to the reference voltage. The first switching means and the second switching means are respectively closed and open in a first operating condition whereby the second terminal of the charge pump acquires a voltage of the same polarity but higher in absolute value than said supply voltage. The first switching means and the second switching means are respectively open and closed in a second operating condition whereby the first terminal of the charge pump acquires a voltage of opposite polarity with respect to said voltage supply.

Bidirectional charge pump generating either a positive or negative voltage

A temperature-related voltage generating circuit has an input terminal receiving a control voltage independent of temperature, and an output terminal delivering a temperature-related control voltage. The input and output terminals are connected together through at least an amplifier stage adapted to set an output reference voltage from a comparison of input voltages. The voltage generating circuit also includes a generator element generating a varying voltage with temperature and connected between a ground voltage reference and a non-inverting input terminal of the amplifier stage. The amplifier stage has an output terminal adapted to deliver a multiple of the varying voltage with temperature to an inverting input terminal of a comparator stage. The comparator stage has its output connected to the temperature-related voltage generating circuit and a non-inverting input terminal receiving the control voltage independent of temperature to evaluate the difference between the control voltage independent of temperature and said voltage being a multiple of the varying voltage with temperature and to output a temperature-related control voltage having at room temperature a mean value which is independent of its thermal differential and increases with temperature. The voltage generating circuit can be incorporated into a regulator for a drain voltage of a single-supply memory cell.

Memory cell voltage regulator with temperature correlated voltage generator circuit

An output circuit for an integrated circuit, includes a first transistor and a second transistor connected in series between a first external voltage and a second external voltage external to the integrated circuit, respectively through first and second electrical connecting paths. The first transistor is for carrying an output line of the integrated circuit to the first external voltage, while the second transistor is for carrying the external line of the integrated circuit to the second external voltage. The second transistor is formed inside a first well of a first conductivity type contained inside a second well of a second conductivity type formed in a substrate of the first conductivity type. The second well of the second conductivity type is connected to the first external voltage through a third electrical connecting path distinct from the first electrical connecting path.

Output circuit for integrated circuits

A negative charge pump circuit comprises a plurality of charge pump stages connected in series to each other. Each stage has a stage input terminal and a stage output terminal. A first stage has the stage input terminal connected to a reference voltage, a final stage has the stage output terminal operatively connected to an output terminal of the charge pump at which a negative voltage is developed; intermediate stages have the respective stage input terminal connected to the stage output terminal of a preceding stage and the respective stage output terminal connected to the stage input terminal of a following stage. Each stage comprises a first N-channel MOSFET with a first electrode connected to the stage input terminal and a second electrode connected to the stage output terminal, a second N-channel MOSFET with a first electrode connected to the stage output terminal and a second electrode connected to a gate electrode of the first N-channel MOSFET, a boost capacitor with one terminal connected to the gate electrode of the first N-channel MOSFET and a second terminal driven by a respective first digital signal switching between the reference voltage and a positive voltage supply, and a second capacitor with one terminal connected to the charge pump stage output terminal and a second terminal connected to a respective second digital signal switching between the reference voltage and the voltage supply. A gate electrode of the second N-channel MOSFET is connected, in the first stage, to a third digital signal switching between the reference voltage and the voltage supply, while in the remaining stage the gate electrode of the second N-channel MOSFET is connected to the stage input terminal.

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Latisana, Italy

Jacopo Mulatti