Micron Technology Incorporated

Jackson N Callaghan

Ji-Hye Gale Shin

Rosa M Avila-Hernandez

Gitanjali T Ghosh

Rachael R Skreen

Kazuaki Ohara

Vyjayanthi Prasad

Methods, apparatuses, and systems related to operations for measuring the quality of a signal received by a memory device and providing feedback. The memory device can sample signal data using a predetermined sequence of timing offsets relative to a reference signal. Additionally or alternatively, the memory device can sample the signal data using a predetermined sequence of reference voltages. The memory device can provide feedback results to a controller regarding the quality of the sampled signal data.

Apparatus with signal quality feedback

An on-die logic analyzer (ODLA) can reduce the time and resources that would otherwise be spent in validating or debugging memory system timings. The ODLA can receive an enable signal with respect to a start command and start a count of clock cycles in response to a first issued command matching the start command defined in a first mode register. The ODLA can stop the count of clock cycles in response to a second issued command matching a stop command defined in a second mode register. The ODLA can write a value indicative of the stopped count to a third mode register or an on-die storage array in response to the stopped count exceeding a previously stored count.

On-die logic analyzer

Growing community of inventors

Milpitas, CA, United States of America

Jackson N Callaghan