3m Innovative Properties Company

3m Innovation Properties Company

Jack Wing Lai

Francis M Aguirre

Peter T Benson

Michele A Craton

David L Phillips

Michael Alan Meis

Gordon D Henson

David L Hofeldt

Joel D Oxman

William Blake Kolb

Mikhail L Pekurovsky

James M Nelson

Patrick R Fleming

Steven P Floeder

Paul Edward Humpal

Mitchell A F Johnson

Rudolf Schmid

Gregory A Kobussen

Stefan K Welker

John A Ramthun

Gregory D Kostuch

Lanny L Harklau

Wenyuan Xu

Korbinian Gerlach

Douglas L Elmore

Chieu S Nguyen

Charles A Evertz

Arthur T Manning

Cure monitoring systems for and methods of monitoring polymerizable material to determine the degree of curing of the polymerizable material. A monitoring light source delivers visible monitoring light at one or more different visible wavelengths and a visible light detector detects the monitoring light diffusely reflected by the polymerizable material. The monitoring light has a wavelength of maximum emission (&#x3bb;max-mon) that does not effectively induce polymerization of the polymerizable material. Change in intensity of the monitoring light reflected from the polymerizable material is used to determine when a selected degree of curing is reached in the polymerizable material.

Cure monitoring systems and methods

A method for coating a work piece with resin including applying a controlled volume of liquid resin to the work piece with an applicator and allowing consecutive streams of resin to meld together to form a self leveling surface. The resin can be actively or passively cured. The work piece can be planar or cylindrical.

Needle coating and in-line curing of a coated workpiece

A radiation curing apparatus comprises a plurality of solid state radiation sources to generate radiation that cures a first material. The solid state radiation sources can be disposed in an array pattern. Optical concentrators, arranged in a corresponding array pattern, receive radiation from corresponding solid state radiation sources. The concentrated radiation is received by a plurality of optical waveguides, also arranged in a corresponding array pattern. Each optical waveguide includes a first end to receive the radiation and a second end to output the radiation. The curing apparatus can be utilized for continuous substrate, sheet, piece part, spot curing, and/or 3D radiation-cure processes.

LED curing apparatus and method

A radiation modifying apparatus comprises a plurality of solid state radiation sources to generate radiation that modifies a first material such as by curing or creating alignment through polarization. The solid state radiation sources can be disposed in an array pattern. Optical concentrators, arranged in a corresponding array pattern, receive radiation from corresponding solid state radiation sources. The concentrated radiation is received by a plurality of optical waveguides, also arranged in a corresponding array pattern. Each optical waveguide includes a first end to receive the radiation and a second end to output the radiation. The radiation modifying apparatus can be utilized for continuous substrate, sheet, piece part, spot curing, and/or 3D radiation-cure processes.

LED modifying apparatus and method

A rotary spectrometer including a plurality of input ports. Each input port may be arranged to receive an optical waveguide carrying electromagnetic radiation. The spectrometer also includes a plurality of optical bandpass filters, which are housed on a first body that rotates under the control of a motor so that each optical bandpass filter may be brought into alignment with each input port. Further, the spectrometer includes a plurality of detector circuits disposed on a second body that rotates with the first body. Each detector circuit is optoelectrically coupled to one of the plurality of optical bandpass filters, thereby resulting in each detector circuit being dedicated to responding to a range of wavelengths determined by the bandpass filter to which it is optoelectrically coupled.

Multiplexing rotary spectrometer

A method and apparatus for measuring the thickness of a coating on a coated surface. The method uses a solid state array of light-sensitive elements to measure light emitted from a fluorescing coating composition. The intensity of the emitted light corresponds to the thickness of the coating composition, and provides a fast and accurate measure of coating thickness.

Low cost thickness measurement method and apparatus for thin coatings

Growing community of inventors

Lake Elmo, MN, United States of America

Jack Wing Lai