Seagate Technology Incorporated

Jack William Lakey

Henry Elwood Davenport

Errol Carl Heiman

Ron Watts

Robert James Hancock

Implementations described and claimed herein provide a method and system for comparing a storage location related to a new write command on a storage device with storage locations of a predetermined number of write commands stored in a first table to determine frequency of write commands to the storage location. If the frequency is determined to be higher than a first threshold, the data related to the write command is stored in a write cache.

Storage device cache

An electronic device power testing method is provided in which applying a nominal voltage to an electronic component, introducing a voltage disruption to the nominal voltage, and repeating the voltage disruption for a specified number of instances is done. The present invention also can be implemented as an electronic device power tester.

Comprehensive application power tester

A method and apparatus for initiating and analyzing an error recovery procedure in a data storage device is disclosed. Error recovery procedures are initiated by the simulation of an injected error event onto a particular location of the storage device. The simulation is implemented by corrupting the differential read signal of the storage device prior to error detection and decoding by the storage device. The operation and control of the software error recovery analysis tool is administered through a software application offering a graphical and interactive environment for measurement and automation. The application, corruption device, and a circuit designed to operate the timing and control of the tool are linked such that communication between the components defines the invention as a whole. During the signal corruption, the application allows the monitoring of any responses to the simulated error events by the data storage device.

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Boulder, CO, United States of America

Jack William Lakey