Taiwan Semiconductor Manufacturing Comp. Ltd.

Jack Deng

Chih-Kung Chang

Fu-Tien Weng

Bii-Junq Chang

Chin Chen Kuo

Yi-Ming Dai

Hung-Jen Hsu

Yu-Kung Hsiao

Te-Fu Tseng

Chung-Sheng Hsiung

Ming-Chang Kao

A method is provided for processing a substrate. The substrate has at least one filter region, a plurality of bond pads, and a plurality of scribe lines arranged around the filter region and bond pads. A first planarization layer is formed above the substrate. The planarization layer has a substantially flat top surface overlying the filter region, the bond pads and the scribe lines. At least one color resist layer is formed over the first planarization layer and within the filter region while the first planarization layer covers the bond pads and the scribe lines.

Image sensor

Image sensor fabrication method and structure

A method of manufacturing a microlens device by depositing a microlens material layer over a substrate that includes photo-sensors. The microlens material layer is then exposed and developed to define microlens material elements, including first microlens material elements and second microlens material elements. Each second microlens material element is substantially greater in thickness relative to each first microlens material element. The microlens material elements are then heated to form a microlens array that includes first microlens array elements, each corresponding to a first microlens material element, and second microlens array elements, each corresponding to a second microlens material element. Each first microlens array element has a substantially greater focal length relative to each second microlens array element. For example, each second microlens array element is substantially greater in thickness relative to each first microlens array element.

Microlens structure for improved CMOS image sensor sensitivity

A method of manufacturing a plurality of microlenses on a substrate comprises forming a grid having raised ridges defining a plurality of openings on the substrate and forming a plurality of patterned photoresist features each disposed within one of the plurality of openings. The plurality of patterned photoresist features can then be reflowed inside the grid.

Advance ridge structure for microlens gapless approach

Growing community of inventors

Jhunan, Taiwan

Jack Deng