Infineon Technologies Ag

Jaap Verheggen

Hendrikus Van Lierop

Alexander Hulsker

Wojciech Kudla

Andre Roger

Romain Ygnace

A Light Detection and Ranging (LIDAR) system includes a LIDAR transmitter and a controller. The LIDAR transmitter, driven by the controller, scans a field of view with laser beams, where each laser beam has a beam width that, when projected into a field of view, coincides with an angle region of the field of view. The LIDAR transmitter transmits a first plurality of laser beams in a first scan, where a first plurality of angle regions covered by the first plurality of laser beams are mutually exclusive of each other. The LIDAR transmitter transmits a second plurality of laser beams in a second scan, where a second plurality of angle regions covered by the second plurality of laser beams are mutually exclusive of each other. Each of the second plurality of angle regions partially overlaps with a different corresponding one of the first plurality of angle regions.

Oversamplng and transmitter shooting pattern for light detection and ranging (LIDAR) system

An apparatus for light detection and ranging is provided. The apparatus includes a reflective surface configured to oscillate about a rotation axis, and a plurality of light sources each configured to controllably emit a respective light beam via an optical system onto the reflective surface. Further, the apparatus includes a controller configured to control emission times of the plurality of light sources so that the reflective surface emits a plurality of light beams to an environment according to a first sequence of beam directions for a first measurement, and according to a second sequence of beam directions for a subsequent second measurement.

Apparatuses and method for light detection and ranging

A method of monitoring a microelectromechanical systems (MEMS) oscillating structure includes: driving the MEMS oscillating structure configured to oscillate about a rotation axis according to an operating response curve during which the MEMS oscillating structure is in resonance, wherein the MEMS oscillating structure is a non-linear resonator; inducing an oscillation decay of the MEMS oscillating structure at predefined tilt angle such that an oscillation of the MEMS oscillating structure decays from the predefined tilt angle over a decay period; measuring at least one characteristic of the oscillation decay; and determining a mechanical health of the MEMS oscillating structure based on the at least one characteristic of the oscillation decay.

Monitoring of MEMS mirror properties

Systems and methods are provided for monitoring properties of a microelectromechanical systems (MEMS) oscillating structure. A system includes a MEMS oscillating structure configured as a non-linear resonator to oscillate about a rotation axis; a driver configured to generate a driving force for driving the MEMS oscillating structure about the rotation axis according to an operating response curve during which the MEMS oscillating structure is in resonance, the driver further configured to decrease the driving force when the MEMS oscillating structure is at a predefined tilt angle to induce an oscillation decay of the MEMS oscillating structure; a measurement circuit configured to measure an oscillation frequency and a tilt angle amplitude of the MEMS oscillating structure during a decay period; and processing circuitry configured to determine at least one characteristic of the MEMS oscillating structure based on at least one of the measured oscillation frequency and the measured tilt angle amplitude.

Growing community of inventors

Wijchen, Netherlands

Jaap Verheggen